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LSM303AGR датащи(PDF) 14 Page - STMicroelectronics

номер детали LSM303AGR
подробное описание детали  Ultra-compact high-performance eCompass module: ultra-low-power 3D accelerometer and 3D magnetometer
PDF  68 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

LSM303AGR датащи(HTML) 14 Page - STMicroelectronics

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Module specifications
LSM303AGR
14/68
DocID027765 Rev 5
M_R
Magnetic RMS noise(6)
High-performance mode
3
mgauss
(RMS)
LA_ST
Linear acceleration self-test
positive difference(7) (8) (9)
FS = ±2 g; normal mode
17
360
LSB
M_ST
Magnetic self-test(10)
15
500
mgauss
Top
Operating temperature range
-40
+85
°C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited
number of samples, not measured during final test for production.
4. Typical zero-g level offset value after MSL3 preconditioning.
5. Offset can be eliminated by enabling the built-in high-pass filter.
6. With low-pass filter or offset cancellation enabled.
7. The sign of “Self-test output change” is defined by the ST bit in CTRL_REG4_A (23h), for all axes.
8. “Self-test output change” is defined as the absolute value of:
OUTPUT[LSb](Self-test enabled) - OUTPUT[LSb](Self-test disabled). 1LSb=4mg at 10bit representation, ±2 g full scale.
9. After enabling the ST bit, correct data is obtained after two samples (low-power mode / normal mode) or after eight samples
(high-resolution mode).
10. Magnetic “self-test” is defined as: OUTPUT[gauss](Self-test enabled) - OUTPUT[gauss](Self-test disabled).
Table 3. Sensor characteristics (continued)
Symbol
Parameter
Test conditions
Min.
Typ.(1)
Max.
Unit



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