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DLPC910 датащи(PDF) 17 Page - Texas Instruments

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номер детали DLPC910
подробное описание детали  Digital Controller for the DLP9000XFLS Digital Micromirror Device
PDF  50 Pages
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производитель  TI1 [Texas Instruments]
домашняя страница  http://www.ti.com
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DLPC910 датащи(HTML) 17 Page - Texas Instruments

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System Data
Training Data
(0100)
INIT_ACTIVE
4:1 Serdes
Din 3:0
Dout
Sys Clk
IO Clk
0
1
DLPC910
www.ti.com
DLPS064A – SEPTEMBER 2015 – REVISED OCTOBER 2015
Feature Description (continued)
7.3.3 Data Valid
The data valid interface consists of four differential pairs: DVALID_A, DVALID _B, DVALID _C, and DVALID _D.
The DVALID signal should be asserted synchronous to the data it is meant to frame. DVALID can be asserted
as:
•
Framing individual row loads with breaks between rows, or
•
Framing block loads - for example, the DLP9000XFLS with 16 blocks allows framing 100 contiguous row
loads, or
•
Framing the entire DMD load where the DVALID stays active for all DMD row loads with zero invalid data
between rows.
If the DVALID frames DMD blocks or the entire DMD, assure that the block and row control signals are adjusted
at the proper locations in the data stream. Refer to Block Mode Operation for further information.
7.3.4 Interface Training
The DLPC910 detects the phase differences between the ½ speed clock (used in the device driving the LVDS
data) and the internally generated ½ speed data clocks to select a clock phase for data capture. This is done by
supplying a simple repeating pattern on all of the data inputs while the INIT_ACTIVE output of the DLPC910 is
high/active. The details of the training pattern are described below.
Figure 3 shows a simple block diagram of the training pattern insertion logic.
Figure 3. Block Diagram of Training Pattern Logic
The expected training pattern is 0100. In Figure 4, the data input to the 4:1 SERDES cells is captured on the
rising edge of the ½ speed system clock. The output latency shown is based on the documentation for the Xilinx
SERDES cells. Individual implementation may vary depending on the type of cells, technology, and design
technique used.
Copyright © 2015, Texas Instruments Incorporated
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