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LTC1286CS8 датащи(PDF) 18 Page - Linear Technology |
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LTC1286CS8 датащи(HTML) 18 Page - Linear Technology |
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18 / 24 page ![]() 18 LTC1286/LTC1298 0.2V reference. If this offset is unacceptable, it can be corrected digitally by the receiving system or by offsetting the “–” input of the LTC1286. Noise with Reduced VREF The total input referred noise of the LTC1286 can be reduced to approximately 400 µV peak-to-peak using a ground plane, good bypassing, good layout techniques and minimizing noise on the reference inputs. This noise is insignificant with a 5V reference but will become a larger fraction of an LSB as the size of the LSB is reduced. For operation with a 5V reference, the 400 µV noise is only 0.33LSB peak-to-peak. In this case, the LTC1286 noise will contribute virtually no uncertainty to the output code. However, for reduced references the noise may become a significant fraction of an LSB and cause undesirable jitter in the output code. For example, with a 2.5V reference this same 400 µV noise is 0.66LSB peak-to-peak. This will reduce the range of input volt- ages over which a stable output code can be achieved by 1LSB. If the reference is further reduced to 1V, the 400 µV noise becomes equal to 1.65LSBs and a stable code may be difficult to achieve. In this case averaging multiple readings may be necessary. This noise data was taken in a very clean setup. Any setup induced noise (noise or ripple on VCC, VREF or VIN) will add to the internal noise. The lower the reference voltage to be used the more critical it becomes to have a clean, noise free setup. Conversion Speed with Reduced VREF With reduced reference voltages, the LSB step size is reduced and the LTC1286 internal comparator over- drive is reduced. Therefore, it may be necessary to reduce the maximum CLK frequency when low values of VREF are used. DYNAMIC PERFORMANCE The LTC1286/LTC1298 have exceptional sampling capa- bility. Fast Fourier Transform (FFT) test techniques are used to characterize the ADC’s frequency response, dis- APPLICATION INFORMATION tortion and noise at the rated throughput. By applying a low distortion sine wave and analyzing the digital output using an FFT algorithm, the ADC’s spectral content can be examined for frequencies outside the fundamental. Figure 11 shows a typical LTC1286 plot. Signal-to-Noise Ratio The Signal-to-Noise plus Distortion Ratio (S/N + D) is the ratio between the RMS amplitude of the fundamental input frequency to the RMS amplitude of all other fre- quency components at the ADC’s output. The output is band limited to frequencies above DC and below one half the sampling frequency. Figure 12 shows a typical spec- tral content with a 12.5kHz sampling rate. Effective Number of Bits The Effective Number of Bits (ENOBs) is a measurement of the resolution of an ADC and is directly related to S/(N+D) by the equation: ENOB = [S/(N + D) – 1.76]/6.02 where S/(N + D) is expressed in dB. At the maximum sampling rate of 12.5kHz with a 5V supply, the LTC1286 maintains above 11 ENOBs at 10kHz input frequency. Above 10kHz the ENOBs gradually decline, as shown in Figure 12, due to increasing second harmonic distortion. The noise floor remains low. FREQUENCY (kHz) 0 –60 –40 0 35 LTC 1286/98 G21 –80 –100 12 46 7 –120 –140 –20 TA = 25°C VCC = VREF = 5V fIN = 5kHz fCLK = 200kHz fSMPL = 12.5kHz Figure 11. LTC1286 Non-Averaged, 4096 Point FFT Plot |
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