поискавой системы для электроныых деталей
  Russian  ▼
ALLDATASHEETRU.COM

X  

AN3181 датащи(PDF) 27 Page - STMicroelectronics

номер детали AN3181
подробное описание детали  Guidelines for obtaining IEC 60335 Class B certification in an STM8 application
PDF  31 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3181 датащи(HTML) 27 Page - STMicroelectronics

Back Button AN3181 Datasheet HTML 23Page - STMicroelectronics AN3181 Datasheet HTML 24Page - STMicroelectronics AN3181 Datasheet HTML 25Page - STMicroelectronics AN3181 Datasheet HTML 26Page - STMicroelectronics AN3181 Datasheet HTML 27Page - STMicroelectronics AN3181 Datasheet HTML 28Page - STMicroelectronics AN3181 Datasheet HTML 29Page - STMicroelectronics AN3181 Datasheet HTML 30Page - STMicroelectronics AN3181 Datasheet HTML 31Page - STMicroelectronics  
Zoom Inzoom in Zoom Outzoom out
 27 / 31 page
background image
AN3181
Class B solution structure
Doc ID 17286 Rev 2
27/31
4.4.6
Watchdog service in run mode test
If the run mode service block is correctly completed, then both window and independent
watchdogs (WDGs) are refreshed at the last step just before returning to the main loop. To
correctly refresh watchdogs, the user must ensure calling STL_DoRunTimeChecks()
routine (see Figure 12) at corresponding intervals in order to be able to properly react to the
time base flag change.
Only one WDG refresh inside the main loop is necessary and contributes to overall
efficiency. There should be no other WDG refresh except the one in
STL_DoRunTimeChecks() routine. Sometimes it is necessary to refresh WDGs at
initialization phase, too. In this instance, the refresh should be outside of any software
infinite loop.
4.4.7
Partial RAM run mode self test
Partial transparent RAM test is performed inside the time base interrupt service. The test
covers the part of the RAM containing the class B variables. One block of six bytes is tested
at every test step. To guarantee coupling fault coverage, consecutive test steps are
performed on memory blocks with an overlapping of two adjacent bytes. During the first
phase, the block content is stored in the storage buffer. The next phase is to perform the
marching destructive tests on all the bytes in the tested RAM block. Then, the final step is to
restore the original content. March X algorithm is faster as two middle marching steps are
skipped over (see Table 4). The last test sequence step is to perform a marching test on the
storage buffer itself, again with the next two additional bytes to cover coupling faults. Then
the whole test is re-initialized and it begins again. In case any fault is detected, FailSafe()
routine is called.
Figure 18.
Partial RAM run mode self test structure)



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31


датащи скачать

Go To PDF Page


ссылки URL



Вашему бизинису помогли Аллдатащит?  [ DONATE ] 

Что такое Аллдатащит   |   реклама   |   контакт   |   Конфиденциальность   |   Ссылка на техническое описание    |   обмен ссыками   |   поиск по производителю
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com