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AN3181 датащи(PDF) 17 Page - STMicroelectronics

номер детали AN3181
подробное описание детали  Guidelines for obtaining IEC 60335 Class B certification in an STM8 application
PDF  31 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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AN3181 датащи(HTML) 17 Page - STMicroelectronics

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AN3181
Class B solution structure
Doc ID 17286 Rev 2
17/31
4
Class B solution structure
4.1
Integrating software into user application
Class B routines are divided into two main processes: periodic run mode self tests and
startup tests. The periodic run mode test must be initialized by the set-up block before it is
applied. All the blocks are checked by sufficient flow control checked at a number of flow
check points (see Section 3.1.3: Class B flow control). All class B variables are kept
redundantly in a pair of control registers stored in the Class B variable space defined by user
(see Section 3.1.2: Class B variables). This variable space is split into two separate RAM
regions which are permanently undergoing the transparent test as a part of run mode tests.
Figure 4: Integration of startup and periodic run mode self tests into application shows the
basic principle of how to integrate the Class B software package into user software. The
reset vector should be forced by the user to STL_StartUp() routine which collects all system
startup self tests. If they pass successfully, then the standard initialization procedure of
C-compiler routine is performed. While the application is running, periodic tests must be
executed at regular intervals. To ensure this, the user must initialize these tests by calling
the initialization routine STL_InitRunTimeChecks() before entering main loop and then
inserting a periodical call of STL_DoRunTimeChecks() at main level. For best results, this
should be inside the main loop. TIM4 (or TIM6 for some devices), which is configured during
initialization routine to generate periodic system interrupts, provides the time base for all the
tests. Short partial transparent RAM March C- or March X check is performed at each
interrupt tick. If any self test fails, FailSafe() routine is called.
Figure 4.
Integration of startup and periodic run mode self tests into application
4.2
Detailed description of startup self tests
The startup self test is forced during initialization phase as the earliest checking process
after resetting the microcontroller (see Figure 4) and before standard application startup



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