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AN3181 датащи(PDF) 17 Page - STMicroelectronics |
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AN3181 датащи(HTML) 17 Page - STMicroelectronics |
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17 / 31 page ![]() AN3181 Class B solution structure Doc ID 17286 Rev 2 17/31 4 Class B solution structure 4.1 Integrating software into user application Class B routines are divided into two main processes: periodic run mode self tests and startup tests. The periodic run mode test must be initialized by the set-up block before it is applied. All the blocks are checked by sufficient flow control checked at a number of flow check points (see Section 3.1.3: Class B flow control). All class B variables are kept redundantly in a pair of control registers stored in the Class B variable space defined by user (see Section 3.1.2: Class B variables). This variable space is split into two separate RAM regions which are permanently undergoing the transparent test as a part of run mode tests. Figure 4: Integration of startup and periodic run mode self tests into application shows the basic principle of how to integrate the Class B software package into user software. The reset vector should be forced by the user to STL_StartUp() routine which collects all system startup self tests. If they pass successfully, then the standard initialization procedure of C-compiler routine is performed. While the application is running, periodic tests must be executed at regular intervals. To ensure this, the user must initialize these tests by calling the initialization routine STL_InitRunTimeChecks() before entering main loop and then inserting a periodical call of STL_DoRunTimeChecks() at main level. For best results, this should be inside the main loop. TIM4 (or TIM6 for some devices), which is configured during initialization routine to generate periodic system interrupts, provides the time base for all the tests. Short partial transparent RAM March C- or March X check is performed at each interrupt tick. If any self test fails, FailSafe() routine is called. Figure 4. Integration of startup and periodic run mode self tests into application 4.2 Detailed description of startup self tests The startup self test is forced during initialization phase as the earliest checking process after resetting the microcontroller (see Figure 4) and before standard application startup |
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