S5000PAL datasheet(72/112 Pages) INTEL

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Intel

® Server Board S5000PAL / S5000XAL TPS

Power and Environmental Specifications

Revision 1.7

Intel order number: D31979-010

8.2.8

Dynamic Loading

The output voltages shall remain within limits for the step loading and capacitive loading specified in the

table below. The load transient repetition rate shall be tested between 50 Hz and 5 kHz at duty cycles

ranging from 10%-90%. The load transient repetition rate is only a test specification. The

Δ step load

may occur anywhere within the MIN load to the MAX load conditions.

Table 38. Transient Load Requirements

Output

Δ Step Load Size

(See note 2)

Load Slew Rate

Test capacitive Load

+3.3V

5.0A

0.25 A/

μsec

250

μF

+5V

6.0A

0.25 A/

μsec

400

μF

12V1+12V2+12V3+12

28.0A

0.25 A/

μsec

2200

μF 1,2

+5VSB

0.5A

0.25 A/

μsec

μF

Notes:

1) Step loads on each 12V output may happen simultaneously.

2) The +12V should be tested with 2200

μF evenly split between the four +12V rails.

8.2.9

Capacitive Loading

The power supply shall be stable and meet all requirements with the following capacitive loading ranges.

Table 39. Capacitive Loading Conditions

Output

MIN

MAX

Units

+3.3V

250

6,800

μF

+5V

400

4,700

μF

+12V1,2,3,4

500 each

11,000

μF

-12V

350

μF

+5VSB

350

μF

8.2.10

Closed-Loop Stability

The power supply shall be unconditionally stable under all line/load/transient load conditions including

capacitive load ranges. A minimum of: 45 degrees phase margin and -10dB-gain margin is required.

Closed-loop stability must be ensured at the maximum and minimum loads as applicable.

8.2.11

Common Mode Noise

The common mode noise on any output shall not exceed 350 mV pk-pk over the frequency band of 10Hz

to 30MHz.

1. The measurement shall be made across a 100 Ω resistor between each of the DC outputs,

including ground, at the DC power connector and chassis ground (power subsystem enclosure).

2. The test set-up shall use an FET probe such as Tektronix* model P6046 or equivalent.

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