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MPC5510 датащи(PDF) 34 Page - Freescale Semiconductor, Inc |
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MPC5510 датащи(HTML) 34 Page - Freescale Semiconductor, Inc |
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34 / 54 page ![]() MPC5510 Microcontroller Family Data Sheet, Rev. 2 Preliminary—Subject to Change Without Notice Electrical Characteristics Freescale Semiconductor 34 2.10 eQADC Electrical Characteristics Table 15. eQADC Conversion Specifications (Operating) Num Characteristic Symbol Min Max Unit 1 ADC Clock (ADCLK) Frequency1 1 Conversion characteristics vary with F ADCLK rate. Reduced conversion accuracy occurs at maximum FADCLK rate. The maximum value is based on 800KS/s and the minimum value is based on 20MHz oscillator clock frequency divided by a maximum 16 factor. FADCLK 112 MHz 2 Conversion Cycles CC 14+2 (or 16) 14+128 (or 142) ADCLK cycles 3 Stop Mode Recovery Time2 2 The specified value is for the case when the 100nF capacitor is not connected to the REFBYPC pin. When the capacitor is connected to the REFBPYC pin, the recovery time is 10ms. TSR 20 — μs 4 Resolution — 1.25 — mV 5 INL: 12 MHz ADC Clock3 3 At V RH – VRL = 5.12 V, one lsb = 1.25 mV = one count, this is an additional count error to the TUE count error. INL12 — 10 Counts 6 DNL: 12 MHz ADC Clock3 DNL12 — 10 Counts 7 Offset Error with Calibration3 OFFWC — 10 Counts 8 Full Scale Gain Error with Calibration GAINWC — 10 Counts 9 Disruptive Input Injection Current 4, 5, 6, 7 4 Below disruptive current conditions, the channel being stressed has conversion values of 0x3FF for analog inputs greater than VRH and 0x000 for values less than VRL. This assumes that VRH ≤ VDDA and VRL ≥ VSSA due to the presence of the sample amplifier. Other channels are not affected by non-disruptive conditions. 5 Exceeding limit may cause conversion error on stressed channels and on unstressed channels. Transitions within the limit do not affect device reliability or cause permanent damage. 6 Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate resistance values using VPOSCLAMP = VDDA + 0.5V and VNEGCLAMP = – 0.3 V, then use the larger of the calculated values. 7 Condition applies to two adjacent pads on the internal pad. IINJ —±1 mA 10 Incremental Error due to injection current. All channels have same 10k Ω < Rs <100kΩ 3 Channel under test has Rs=10k Ω, IINJ=IINJMAX,IINJMIN EINJ — ±6 Counts 11 Total Unadjusted Error for single ended conversions with calibration3, 8, 9, 10 8 The TUE specification will always be better than the sum of the INL, DNL, offset, and gain errors due to canceling errors. 9 TUE includes all internal device error such as internal reference variation (75% Ref, 25% Ref) 10 Depending on the customer input impedance, the Analog Input Leakage current (DC Electrical specification) may affect the actual TUE measured on analog channels shared digital pins. TUE — ±10 Counts 12 Source Impedance11 11 If R S is greater than 1 k Ohm, be sure to calculate the affect of pin leakage and use the proper sampling time, to ensure that you get the accuracy required. RS — 100k Ohm |
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