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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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MPC5510 датащи(PDF) 24 Page - Freescale Semiconductor, Inc |
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MPC5510 датащи(HTML) 24 Page - Freescale Semiconductor, Inc |
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24 / 54 page  MPC5510 Microcontroller Family Data Sheet, Rev. 2 Preliminary—Subject to Change Without Notice Electrical Characteristics Freescale Semiconductor 24 2.3 ESD Characteristics Table 5. ESD Ratings1, 2 1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits. 2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification requirements. Complete DC parametric and functional testing shall be performed per applicable device specification at room temperature followed by hot temperature, unless specified otherwise in the device specification Characteristic Symbol Value Unit ESD for Human Body Model (HBM) 2000 V HBM Circuit Description R1 1500 Ohm C100 pF ESD for Field Induced Charge Model (FDCM) 500 (all pins) V 750 (corner pins) Number of Pulses per pin: Positive Pulses (HBM) Negative Pulses (HBM) — — 1 1 — — Interval of Pulses — 1 second |
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