ST72334J2TASLASHXXX datasheet(124/150 Pages) STMICROELECTRONICS

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15.7 EMC CHARACTERISTICS

Susceptibility tests are performed on a sample ba-

sis during product characterization.

15.7.1 Functional EMS

(Electromagnetic Susceptibility)

Based on a simple running application on the

product (toggling two LEDs through I/O ports), the

product is stressed by two electromagnetic events

until a failure occurs (indicated by the LEDs).

■ ESD:

Electrostatic Discharge (positive and

negative) is applied on all pins of the device until

a functional disturbance occurs. This test

conforms with the IEC 1000-4-2 standard.

■ FTB: A Burst of Fast Transient voltage (positive

and negative) is applied to VDD and VSS through

a 100pF capacitor, until a functional disturbance

occurs. This test conforms with the IEC 1000-4-

4 standard.

A device reset allows normal operations to be re-

sumed.

Figure 73. EMC Recommended star network power supply connection 2)

Notes:

1. Data based on characterization results, not tested in production.

2. The suggested 10µF and 0.1µF decoupling capacitors on the power supply lines are proposed as a good price vs. EMC

performance trade-off. They have to be put as close as possible to the device power supply pins. Other EMC recommen-

dations are given in other sections (I/Os, RESET, OSCx pin characteristics).

Symbol

Parameter

Conditions

Neg 1)

Pos 1)

Unit

VFESD

Voltage limits to be applied on any I/O pin

to induce a functional disturbance

VDD=5V, TA=+25°C, fOSC=8MHz

conforms to IEC 1000-4-2

-1

VFFTB

Fast transient voltage burst limits to be ap-

plied through 100pF on VDD and VDD pins

to induce a functional disturbance

VDD=5V, TA=+25°C, fOSC=8MHz

conforms to IEC 1000-4-4

-4

VDD

VSS

0.1µF

10µF

VDD

ST72XXX

VSSA

VDDA

0.1µF

POWER

SUPPLY

SOURCE

ST7

DIGITAL NOISE

FILTERING

EXTERNAL

NOISE

FILTERING

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