ADIS16354SLASHPCBZ datasheet(20/28 Pages) AD

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ADIS16354

Rev. 0 | Page 20 of 28

STATUS AND DIAGNOSTICS

The ADIS16354 provides a number of status and diagnostic

functions. Table 27 provides a summary of these functions,

along with their appropriate control registers.

Table 27. Status and Diagnostic Functions

Function

Data-ready input/output indicator

MSC_CTRL

Self-test, mechanical check for sensor element

MSC_CTRL

Status: Check for predefined error conditions

STATUS

Flash memory endurance

ENDURANCE

Alarms: Configure and check for user-specific

conditions

ALM_MAG1

ALM_MAG2

ALM_SMPL1

ALM_SMPL2

ALM_CTRL

Data-Ready Input/Output Indicator

The data-ready function provides an indication of updated

output data. The MSC_CTRL register allows the user to config-

ure either of the general-purpose input/output pins (DIO1 or

DIO2) as a data-ready indicator signal.

Table 28. MSC_CTRL Register Definition

Address

Default

Format

Access

0x35, 0x34

0x0000

N/A

R/W

Table 29. MSC_CTRL Bit Descriptions

Bits

Description

[15:11]

Not used

[10]

Internal self-test enable (clears on completion)

1 = enabled, 0 = disabled

[9]

Manual self-test, negative stimulus

1 = enabled, 0 = disabled

[8]

Manual self-test, positive stimulus

1 = enabled, 0 = disabled

[7]

Linear acceleration bias compensation for gyroscopes

1 = enabled, 0 = disabled

[6]

Linear accelerometer origin alignment

1 = enabled, 0 = disabled

[5:3]

Not used

[2]

Data-ready enable

1 = enabled, 0 = disabled

[1]

Data-ready polarity

1 = active high, 0 = active low

[0]

Data-ready line select

1 = DIO2, 0 = DIO1

Self-Test

The MSC_CTRL register also provides a self-test function,

which verifies the MEMS sensor’s mechanical integrity. There

are two different self-test options: internal self-test and external

self-test.

The internal test provides a simple, two-step process for

checking the MEMS sensor.

Start the process by writing a 1 to Bit 10 in the MSC_CTRL

Check the result by reading Bit 5 of the STATUS register.

If a failure is indicated, then Bits [10:15] of the STATUS register

indicate which of the six sensors it is associated with.

The entire cycle takes approximately 35 ms and the output data

is not available during this time. The external self-test is a static

condition that can be enabled and disabled. In this test, both

positive and negative gyroscope MEMS sensor movements are

available. For the accelerometers, only positive MEMS sensor

movement is available.

After writing to the appropriate control bit, the output registers

reflect the changes after a delay that reflects the response time

associated with the sensor/signal conditioning circuit. For

example, the standard 350 Hz bandwidth reflects an exponen-

tial response with a time constant of 0.45 ms. Note that the

digital filtering impacts this delay as well. The appropriate bit

definitions for self-test are listed in Table 28 and Table 29.

Flash Memory Endurance

The ENDURANCE register maintains a running count of writes

to the flash memory. It provides up to 32,768 counts. Note that

if this count is exceeded, the register wraps around and goes

back to zero, before beginning to increment again.

Table 30. ENDURANCE Register Definition

Address

Default

Format

Access

0x01, 0x00

N/A

Binary

Read only

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