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PCM1742E/2K датащи(PDF) 29 Page - Texas Instruments

номер детали PCM1742E/2K
подробное описание детали  24-Bit, 192-kHz Sampling, Enhanced Multilevel, Delta-Sigma, Audio Digital-to-Analog Converter
PDF  40 Pages
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производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
Logo TI2 - Texas Instruments

PCM1742E/2K датащи(HTML) 29 Page - Texas Instruments

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KEY PERFORMANCE PARAMETERS AND MEASUREMENT
Total Harmonic Distortion + Noise
S/PDIF
Receiver
Evaluation Board
f
− 3dB = 54kHz or 108kHz
PCM1742
DEM−DAI1742
2nd−Order
Low−Pass
Filter
Notch Filter
Band Limit
HPF = 22Hz
LPF = 30kHz
f
C = 1kHz
rms Mode
0dBFS,
1kHz Sine Wave
S/PDIF
Output
Analyzer
and
Display
20kHz
Apogee
Filter
Digital
Generator
Dynamic Range
PCM1742
SBAS176A – DECEMBER 2000 – REVISED APRIL 2005
This section provides information on how to measure key dynamic performance parameters for the PCM1742. In
all cases, a System Two™ Cascade audio measurement system by Audio Precision™ or equivalent audio
measurement system is used to perform the testing.
Total harmonic distortion + noise (THD+N) is a significant figure of merit for audio DACs, because it takes into
account both harmonic distortion and all noise sources within a specified measurement bandwidth. The true rms
value of the distortion and noise is referred to as THD+N. Figure 35 shows the test setup for THD+N
measurements.
For the PCM1742, THD+N is measured with a full-scale, 1-kHz digital sine wave as the test stimulus at the input
of the DAC. The digital generator is set to a 24-bit audio word length and a sampling frequency of 44.1 kHz or 96
kHz. The digital generator output is taken from the unbalanced S/PDIF connector of the measurement system.
The S/PDIF data is transmitted via a coaxial cable to the digital audio receiver on the DEM-DAI1742
demonstration board. The receiver is then configured to output 24-bit data in either I
2S or left-justified data
format. The DAC audio interface format is programmed to match the receiver output format. The analog output is
then taken from the DAC post filter and connected to the analog analyzer input of the measurement system. The
analog input is band-limited using filters resident in the analyzer. The resulting THD+N is measured by the
analyzer and displayed by the measurement system.
Figure 35. Test Setup for THD+N Measurements
Dynamic range is specified as A-weighted, THD+N measured with a –60-dBFS, 1-kHz digital sine wave stimulus
at the input of the DAC. This measurement is designed to give a good indicator of the DAC performance given a
low-level input signal.
The measurement setup for the dynamic range measurement is shown in Figure 36 and is similar to the THD+N
test setup discussed previously. The differences include the band limit filter selection, the additional A-weighting
filter, and the –60-dBFS input level.
29



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