11

6.0 DC INPUT ELECTRICAL CHARACTERISTICS (Pre- and Post-Radiation)*

Notes:

* Post-radiation performance guaranteed at 25

°C per MIL-STD-883 Method 1019, Condition A up to a TID level of 1.0E6 rad(Si).

include: TEST, PD/DIV, PE/HD, FS, nF[1:0], DS[1:0].

2. Capacitance is measured for initial qualification and when design changes may affect the input/output capacitance. Capacitance is measured between the designated

3. Pin FS is guaranteed by functional testing.

4. For pin FB, this specification is supplied as a design limit, but is neither guaranteed nor tested.

Symbol

Description

Conditions

Min.

Max.

Units

4

High-level input voltage

(XTAL1, FB and sOE inputs)

2.0

--

V

4

Low-level input voltage

(XTAL1, FB and sOE inputs)

--

0.8

V

1, 3

High-level input voltage

--

V

1, 3

Mid-level input voltage

V

1, 3

Low-level input voltage

--

0.6

V

Input leakage current

(XTAL1, FB and sOE inputs)

-5

5

μA

1

3-Level input DC current

--

200

μA

-50

50

μA

-200

--

μA

Power-down current

TEST & sOE = HIGH;

XTAL1, PD/DIV, FB, FS, & PE/

HD = LOW;

All other inputs are floated;

Outputs are not loaded

--

100

μA

--

150

μA

--

4.5

mA

2

Input pin capacitance

2-level inputs

8.5

pF

2

Input pin capacitance

3-level inputs

15

pF