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UT7R995C датащи(PDF) 7 Page - Aeroflex Circuit Technology |
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UT7R995C датащи(HTML) 7 Page - Aeroflex Circuit Technology |
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7 / 22 page ![]() 7 3.0 PIN DESCRIPTION Flatpack Pin No. Name I/O Type Description 37 XTAL1 I LVTTL Primary reference clock input. When interfacing a single-ended reference clock to the UT7R995 or UT7R995C, this input must be driven by an LVTTL/LVCMOS clock source. If a quartz crystal is used as the reference clock source (UT7R995C only), the second pin on the crystal must be connected to XTAL2. If a singled ended reference clock is supplied to this pin, then XTAL2 should be left unconnected. 36 N/C -- -- No Connect. UT7R995 Only. XTAL2 O N/A Feedback output from the on-board crystal oscillator. When a crystal is used to supply the reference clock for the UT7R995C, this pin must be connected to the second terminal of the quartz crystal. If a single-ended reference clock is supplied to XTAL1, then this output should be left unconnected. 13 FB I LVTTL Feedback input for the PLL. When FB is not driven by an active clock output the PLL will run to its maximum frequency, unless the device is placed in power-down. 28 TEST 1 I 3-Level Built-in test control signal. When Test is set to the MID or HIGH level, it disables the PLL and the XTAL1 reference frequency is driven to all outputs (except for the conditions described in note 1). Set Test LOW for normal operation. 2.0 RADIATION HARDNESS Table 13: Radiation Hardness Design Specifications Notes: 1. The UT7R995/C are latchup immune to particle LETs >109 MeV-cm2/mg. 2. Worst case temperature and voltage of TC = +125 oC, V DD = 3.6V, VDDQ1/Q3/Q4 = 3.6V for SEL. 3. Worst case temperature and voltage of TC = +25 oC, V DD = 3.0V, VDDQ1/Q3/Q4 = 3.0V for SEU. 4. All SEU data specified in this datasheet is based on the storage elements used in the UT7R995/C. 5. For characterization data on the UT7R995/C SET performance over allowable operating ranges, please contact the factory. Parameter Limit Units Total Ionizing Dose (TID) >1E6 rads(Si) Single Event Latchup (SEL) 1, 2 >109 MeV-cm2/mg Onset Single Event Upset (SEU) LET Threshold 3, 4 >109 MeV-cm2/mg Onset Single Event Transient (SET) LET Threshold (@ 50MHz; FS=L)5 >74 MeV-cm2/mg Neutron Fluence 1.0E14 n/cm2 |
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