PAC7136 datasheet(5/56 Pages) FREESCALE

5 / 56 page

ElectricalCharacteristics

MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2

Preliminary

Freescale Semiconductor

3.3

ESD Protection and Latch-up Immunity

All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade

Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body

Model (HBM), the Machine Model (MM) and the Charge Device Model.

A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device

specification. Complete DC parametric and functional testing is performed per the applicable device

specification at room temperature followed by hot temperature, unless specified otherwise.

Voltage difference VDDA – VRH

VDDA – VRH

–0.3

+6.0

A10

Digital I/O Input Voltage

VIN

–0.3

+6.0

A11

XFC, EXTAL, XTAL inputs

VILV

–0.3

+3.0

A12

TEST input

VTEST

–0.3

— 2

Instantaneous Maximum Current 3

A13

Single pin limit for XFC, EXTAL, XTAL 4

–25

+25

A14

Single pin limit for all digital I/O pins 5

–25

+25

A15

Single pin limit for all analog input pins 5

–25

+25

A16

Single pin limit for TEST 2

–0.25

A17

Storage Temperature Range

stg

–65

+155

°C

NOTES:

1. The device contains an internal voltage regulator to generate the logic and PLL supply from the I/O supply. The

absolute maximum ratings apply when the device is powered from an external source.

2. This pin is clamped low to VSSX, but not clamped high, and must be tied low in applications.

3. Input must be current limited to the value specified. To determine the value of the required current-limiting resistor,

use the larger of the calculated values using VPOSCLAMP = VDDA + 0.3V and VNEGCLAMP = –0.3 V.

4. These pins are internally clamped to VSSPLL and VDDPLL.

5. All I/O pins are internally clamped to VSSX and VDDX, VSSR and VDDR or VSSA and VDDA.

Table 5. ESD and Latch-up Test Conditions

Model

Description

Symbol

Value

Unit

Human Body

Series Resistance

1500

Ohm

Storage Capacitance

100

Number of Pulses per pin

positive

negative

——

Machine

Series Resistance

Ohm

Storage Capacitance

200

Number of Pulse per pin

positive

negative

——

Latch-up

Minimum input voltage limit

–2.5

Maximum input voltage limit

7.5

Table 4. Absolute Maximum Ratings (continued)

Num

Rating

Symbol

Min

Max

Unit

PAC7136 датащи(PDF) 5 Page - Freescale Semiconductor, Inc

PAC7136 датащи(HTML) 5 Page - Freescale Semiconductor, Inc

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56

датащи скачать

ссылки URL