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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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PAC7136 датащи(PDF) 35 Page - Freescale Semiconductor, Inc |
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PAC7136 датащи(HTML) 35 Page - Freescale Semiconductor, Inc |
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35 / 56 page  ElectricalCharacteristics MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2 Preliminary Freescale Semiconductor 35 3.13.8 NVM Reliability The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is incremented every time a sector or mass erase event is executed. NOTE All values shown in Table 36 are target values and subject to characterization. For Flash cycling performance, each program operation must be preceded by an erase. Table 36. NVM Reliability Characteristics Conditions shown in Table 7 unless otherwise noted. Num C Rating Min Unit X11 C Program/Data Flash Program/Erase endurance (–40C to +125C) 10,000 Cycles X12 C Program/Data Flash Data Retention Lifetime 15 Years |
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