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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM29LV640MT100REF датащи(PDF) 46 Page - Advanced Micro Devices |
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AM29LV640MT100REF датащи(HTML) 46 Page - Advanced Micro Devices |
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46 / 66 page  44 Am29LV640MT/B 26190C8 February 1, 2007 D A TA SH EE T TEST CONDITIONS Table 15. Test Specifications Note: If V IO < VCC, the reference level is 0.5 VIO. KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Note: Diodes are IN3064 or equivalent Figure 12. Test Setup Test Condition All Speeds Unit Output Load 1 TTL gate Output Load Capacitance, C L (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels (See Note) 1.5 V Output timing measurement reference levels 0.5 VIO V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 0.5 VIO V Output Measurement Level Input Note: If V IO < VCC, the input measurement reference level is 0.5 VIO. Figure 13. Input Waveforms and Measurement Levels |
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