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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM29BDS640G датащи(PDF) 48 Page - Advanced Micro Devices |
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AM29BDS640G датащи(HTML) 48 Page - Advanced Micro Devices |
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48 / 77 page  46 Am29BDS640G 25903C2 May 9, 2006 Data Sheet Test Conditions Key to Switching Waveforms Switching Waveforms Figure 9. Input Waveforms and Measurement Levels Note: Diodes are IN3064 or equivalent Figure 8. Test Setup Table 16. Test Specifications CL Device Under Test Test Condition All Speed Options Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–VIO V Input timing measurement reference levels VIO/2 V Output timing measurement reference levels VIO/2 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VIO 0.0 V Output Measurement Level Input VIO/2 VIO/2 All Inputs and Outputs |
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