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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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L9961 датащи(PDF) 22 Page - STMicroelectronics |
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L9961 датащи(HTML) 22 Page - STMicroelectronics |
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22 / 63 page  Table 15. NTC measurement parameters Symbol Parameter Test conditions Min. Typ. Max. Unit Pin VNTC_RANGE NTC pin voltage input measurement range Ratiometric, design info 0.2 VVREG V NTC VNTC_RES Cell voltage measurement resolution Design info 0.806 (VVREG/212 ) mV NTC NBIT ADC bit number Design info 12 bit NTC INTC_LEAK NTC leakage current ADC not converting 150 nA NTC VNTC_GAIN_ERR NTC gain error 0.2 V ≤ VNTC ≤ VREG -40 °C< TJ<105 °C -0.8 +0.8 % NTC VNTC_OFFSET_ERR NTC Offset Error -2 +2 LSB NTC VNTC_NOISE NTC Conversion noise 1 LSB rms NTC TTEMP_FILTER NTC acquisition filter time Tested by SCAN 0.8 ms NTC VNTC_OT_TH Programmable NTC OT threshold (12 bit) VNTCOTTH=VNTC_RES*CODE TestedbySCAN 0 VVREG V NTC NNTC_OT_CNT_TH Programmable NTC OT event counter threshold (4 bit) Tested by SCAN 1 15 events NTC VNTC_SEVERE_OT_ DELTA_TH Programmable NTC severe OT threshold (negative delta in respect to NTC OT Threshold, 12 bit) VNTCSEVEREOTTH=VNTCOTTH −VNTC_RES*CODE In case of underflow, the VNTCSEVEREOTTHissaturatedtothe min specified value Tested by SCAN 0 VVREG V NTC VNTC_UT_TH Programmable NTC UT threshold (12 bit) VNTCUTTH=VNTC_RES*CODE TestedbySCAN 0 VVREG V NTC NNTC_UT_CNT_TH Programmable NTC UT event counter threshold (4 bit) Tested by SCAN 1 15 events NTC 3.4.4 Die temperature monitor (TJ) The die temperature step of the voltage conversion routine monitors L9961 junction temperature. This step is always enabled. The die temperature is encoded according to the following formula: Die temperature measurement Tj°C =343.165−0.196*DIE_TEMP_MEAS (1) Die temperature measurements are stored in the DIE_TEMP_MEAS register and compared to a programmable threshold in order to detect the failures listed in Table 18. Table 16. Die temperature monitor diagnostics Fault type Assertion condition IC reaction to assertion Release condition IC reaction to flag clear Maskable DIE OT If Die temperature raises above TOT_TH, the DIE_OT fault is acknowledged The DIE_OT flag is set If Die temperature falls below TOT_TH – TOT_HYST, the DIE_OT flag can be cleared by MCU upon read Charge FET is restored to the status defined by the CHG_ON bit DIE_OT_PRDRV_MSK masks reaction on CHG/DCHG pins L9961 Voltage conversion routine DS14012 - Rev 1 page 22/63 |
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