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L9961 датащи(PDF) 19 Page - STMicroelectronics |
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L9961 датащи(HTML) 19 Page - STMicroelectronics |
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19 / 63 page ![]() 3.4.2 Battery stack monitor (VB) The battery stack monitor, (VB), of the voltage conversion routine monitors the battery stack voltage measuring the VB pin through an internal divider. This function is enabled by programming the corresponding VB_EN I2C bit: if disabled, this step is skipped. To limit power consumption, the internal voltage divider is connected to VB pin at the beginning of the Section 3.4 Voltage conversion routine and it is disconnected right after the VB measurement step is completed. Stack voltage measurements are stored in the VB_MEAS register and compared to programmable thresholds in order to detect the failures listed in Table 12. Table 12. Battery stack monitor diagnostics Fault type Assertion condition IC reaction to assertion Release condition IC reaction to flag clear Maskable VB UV If VB voltage falls below VB_UV_TH, the corresponding UV counter is incremented by 1 The VB_UV flag is set If VB voltage raises above VB_UV_TH, the corresponding UV counter is decremented by 1. The discharge FET is restored to the status defined by the DCHG_ON bit VB_EN masks measurement execution. When disabled, the VB_UV flag can always be cleared upon read If the UV counter reaches VB_UV_CNT_TH, it saturates and the VB UV fault is acknowledged The discharge FET is turned OFF If the UV counter reaches zero, the VB_UV flag can be cleared by MCU FAULTN line is released VB_UV_PRDRV_MS K masks reaction on DCHG pin FAULTN line is asserted VB_UV_FAULTN_MS K masks reaction on FAULTN pin VB OV If VB voltage raises above VB_OV_TH, the corresponding OV counter is incremented by 1 The VB_OV flag is set If VB voltage falls below VB_OV_TH, the corresponding OV counter is decremented by 1. The charge FET is restored to the status defined by the corresponding I2C bit VB_EN masks measurement execution. When disabled, the VB_OV flag can always be cleared upon read If the OV counter reaches VB_OV_CNT_TH, it saturates and the VB OV fault is acknowledged The charge FET is turned OFF If the OV counter reaches zero, the VB OV flag can be cleared by MCU FAULTN line is released VB_OV_PRDRV_MS K masks reaction on CHG pin FAULTN_SAFE is pulled low for TFAULTN_SAFE_LOW VB_OV_RST_MSK masks reaction FAULTN_SAFE pin FAULTN line is asserted VB_OV_FAULTN_MS K masks reaction on FAULTN pin VB vs. sum of cells plausibility fail If the absolute value of the difference between VB_MEAS and VCELL_SUM is greater than VB_VSUM_MAX_DIF F_TH, the plausibility check fail is acknowledged The VB_SUM_CHECK_F AIL flag is set If the absolute value of the difference between VB_MEAS and VCELL_SUM falls below the VB_VSUM_MAX_DIF F_TH, the VB_SUM_CHECK_F AIL flag can be cleared by MCU The charge FET is restored to the status defined by the CHG_ON bit VB_EN masks measurement execution. When disabled, the VB_SUM_CHECK_F AIL flag can always be cleared upon read Both charge and Discharge FETs are turned OFF The discharge FET is restored to the status defined by the DCHG_ON bit VB_SUM_CHEC_PR DRV_MSK masks reaction on CHG/ DCHG pins Balancing is interrupted on all cells FUSE pre-driver is disabled VB_SUM_CHEC_FU SE_MSK masks reaction on FUSE pin FUSE pre-driver is enabled Balancing FETs are restored to the status defined by the corresponding BAL<x>_ON bit VB_SUM_CHEC_BA L_MSK masks reaction on balancing L9961 Voltage conversion routine DS14012 - Rev 1 page 19/63 |
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