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XGS датащи(PDF) 40 Page - ON Semiconductor |
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XGS датащи(HTML) 40 Page - ON Semiconductor |
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40 / 53 page ![]() XGS Family www.onsemi.com 40 DC ELECTRICAL CHARACTERISTICS The DC electrical characteristics of the XGS 12000/8000 sensor are listed in Tables 17 through 28. Table 17. DC ELECTRICAL CHARACTERISTICS Symbol Definition Condition Min Typ Max Unit VDD Core Digital Voltage 1.1 1.2 1.3 V VDD_IO I/O Digital Voltage 1.7 / 2.7 1.8 / 2.8 1.9 / 2.9 V VAA Analog Voltage Dedicated Power Supply 2.7 2.8 2.9 V VAA_PIX Pixel Supply Voltage 2.9 3 3.1 V VAA_PIX_BST Pixel Booster Supply 2.9 3 3.1 V VAA_RD Row Driver Supply 2.9 3 3.1 V VDD_SLVS HiSPi Supply Voltage 0.3 / 1.1 0.4 / 1.2 0.5 / 1.3 V VDD_PLL PLL Supply Voltage 2.7 2.8 2.9 V VIH Input HIGH Voltage VDD_IO * 0.7 – VDD_IO + 0.5 V VIL Input LOW Voltage −0.5 – VDD_IO * 0.3 V VOH Output HIGH Voltage VDD_IO – 0.3 – – V VOL Output LOW voltage VDD_IO = 2.8V – – 0.4 V CAUTION: Stresses greater than those listed in Table 18 below may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specifica- tion is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 18. ABSOLUTE MAXIMUM RATINGS Symbol Parameter Min Max Unit ABS VDD_SLVS ABS Rating for 0.4 V/1.2 V Supply –0.5 1.5 V ABS VDD ABS Rating for 1.2 V Supply –0.5 1.5 V ABS VDD_IO ABS Rating for 1.8 V/2.8 V Supply –0.5 3.2 V ABS VDD_PLL ABS Rating for 2.8 V Supply –0.5 3.2 V ABS VAA ABS Rating for 2.8 V Supply –0.5 3.2 V ABS VAA_PIX, VAA_RD, VAA_PIX_BST ABS Rating for 3.0 V Supply –0.5 3.6 V TSTG ABS Storage Temperature Range −40 +150 °C ABS Storage Humidity Range at 85°C 85 %RH Electrostatic Discharge (ESD) (ANSI / ESDA / JEDEC Standard) Human Body Model (HBM): JS−001−2014 2000 V Charged Device Model (CDM): JS−002−2014 500 LU Latch−Up: JESD−78 100 mA Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 16.Exposure to absolute maximum rating conditions for extended periods may affect reliability. 17.Operating ratings are conditions in which operation of the device is intended to be functional. 18.ON Semiconductor recommends that customers become familiar with, and follow the procedures in JEDEC Standard JESD625 A. Refer to (AN52561/D). Long term exposure toward the maximum storage temperature will accelerate color filter degradation. 19.Caution needs to be taken to avoid dried stains on the underside of the glass due to condensation. The glass lid glue is permeable and can absorb moisture if the sensor is placed in a high % RH environment. |
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