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XGS датащи(PDF) 40 Page - ON Semiconductor

номер детали XGS
подробное описание детали  XGS 12000, XGS 9400 and XGS 8000 Global Shutter CMOS Image Sensors
PDF  53 Pages
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производитель  ONSEMI [ON Semiconductor]
домашняя страница  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

XGS датащи(HTML) 40 Page - ON Semiconductor

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DC ELECTRICAL CHARACTERISTICS
The DC electrical characteristics of the XGS 12000/8000 sensor are listed in Tables 17 through 28.
Table 17. DC ELECTRICAL CHARACTERISTICS
Symbol
Definition
Condition
Min
Typ
Max
Unit
VDD
Core Digital Voltage
1.1
1.2
1.3
V
VDD_IO
I/O Digital Voltage
1.7 / 2.7
1.8 / 2.8
1.9 / 2.9
V
VAA
Analog Voltage
Dedicated Power Supply
2.7
2.8
2.9
V
VAA_PIX
Pixel Supply Voltage
2.9
3
3.1
V
VAA_PIX_BST
Pixel Booster Supply
2.9
3
3.1
V
VAA_RD
Row Driver Supply
2.9
3
3.1
V
VDD_SLVS
HiSPi Supply Voltage
0.3 / 1.1
0.4 / 1.2
0.5 / 1.3
V
VDD_PLL
PLL Supply Voltage
2.7
2.8
2.9
V
VIH
Input HIGH Voltage
VDD_IO * 0.7
–
VDD_IO + 0.5
V
VIL
Input LOW Voltage
−0.5
–
VDD_IO * 0.3
V
VOH
Output HIGH Voltage
VDD_IO – 0.3
–
–
V
VOL
Output LOW voltage
VDD_IO = 2.8V
–
–
0.4
V
CAUTION: Stresses greater than those listed in Table 18 below may cause permanent damage to the device. This is a stress rating only,
and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specifica-
tion is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Table 18. ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Min
Max
Unit
ABS VDD_SLVS
ABS Rating for 0.4 V/1.2 V Supply
–0.5
1.5
V
ABS VDD
ABS Rating for 1.2 V Supply
–0.5
1.5
V
ABS VDD_IO
ABS Rating for 1.8 V/2.8 V Supply
–0.5
3.2
V
ABS VDD_PLL
ABS Rating for 2.8 V Supply
–0.5
3.2
V
ABS VAA
ABS Rating for 2.8 V Supply
–0.5
3.2
V
ABS VAA_PIX, VAA_RD,
VAA_PIX_BST
ABS Rating for 3.0 V Supply
–0.5
3.6
V
TSTG
ABS Storage Temperature Range
−40
+150
°C
ABS Storage Humidity Range at 85°C
85
%RH
Electrostatic Discharge (ESD)
(ANSI / ESDA / JEDEC Standard)
Human Body Model (HBM): JS−001−2014
2000
V
Charged Device Model (CDM): JS−002−2014
500
LU
Latch−Up: JESD−78
100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
16.Exposure to absolute maximum rating conditions for extended periods may affect reliability.
17.Operating ratings are conditions in which operation of the device is intended to be functional.
18.ON Semiconductor recommends that customers become familiar with, and follow the procedures in JEDEC Standard JESD625 A. Refer
to (AN52561/D). Long term exposure toward the maximum storage temperature will accelerate color filter degradation.
19.Caution needs to be taken to avoid dried stains on the underside of the glass due to condensation. The glass lid glue is permeable and can
absorb moisture if the sensor is placed in a high % RH environment.



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