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MF4SAM3 датащи(PDF) 18 Page - NXP Semiconductors

номер детали MF4SAM3
подробное описание детали  MIFARE SAM AV3 secure access module
PDF  31 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

MF4SAM3 датащи(HTML) 18 Page - NXP Semiconductors

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NXP Semiconductors
MF4SAM3
MIFARE SAM AV3 secure access module
MF4SAM3
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2019. All rights reserved.
Product short data sheet
Rev. 3.0 — 2 August 2019
COMPANY PUBLIC
561930
18 / 31
9 Dynamic characteristics
Remark: The P6022y VB only supports one single IO1.
9.1 General, ISO/IEC 7816 I/O and ISO/IEC 14443 I/O interfaces
Table 10. Electrical AC characteristics of IO1, IO2, IO3, CLK and RST_N
Conditions: VDD = 1.62 V to 5.5 V; VSS = 0 V; Tamb = -25°C to +85 °C, unless otherwise specified
Symbol Parameter
Conditions
Min
Typ[1]
Max
Unit
Input/Output: IO1, IO2 and IO3
[2]
-
-
1
μs
trIO
I/O Input rise time
Input/reception mode
[3]
-
-
0.25 ×
tIOWx_min
μs
[2]
-
-
1
μs
tfIO
I/O Input fall time
Input/reception mode
[3]
-
-
0.25 ×
tIOWx_min
μs
trOIO
I/O Output rise time
Output/transmission mode; CL
= 30 pF
-
-
0.1
μs
tfOIO
I/O Output fall time
Output/transmission mode; CL
= 30 pF
-
-
0.1
μs
Inputs: CLK and RST_N
fCLK
External clock frequency
in ISO/IEC 7816 UART
applications
tCLKW, Tamb and VDD in their
spec'd limits
[4]
0.85
-
11.5
MHz
tCLKW
Clock pulse width i.r.t. clock
period (positive pulse duty
cycle of CLK)
[5]
40
-
60
%
trCLK
CLK input rise time
[6]
-
-
see
[6]
tfCLK
CLK input fall time
[6]
-
-
see
[6]
trRST
RST_N input rise time
[7]
-
-
400
μs
tfRST
RST_N input fall time
[7]
-
-
400
μs
tRW
Reset pulse width (RST_N low)
40
-
-
μs
tWKP
Wake-up time from SLEEP
mode
fCLKmin ≤ fCLK ≤ fCLKmax
-
17
20
μs
level triggered ext.int.
-
20
-
μs
tWKPIO
I/Ox LOW time for wake-up
from SLEEP mode
edge triggered ext.int.
-
20
-
μs
tWKPRST RST_N LOW time for wake-up
from SLEEP mode
40
-
-
μs
Inputs: CLK, RST_N, IO1, IO2, IO3
CPIN
Pin capacitances CLK, RST_N,
IO1, IO2, IO3
Test frequency = 1 MHz; Tamb
= 25 °C
-
-
10
pF
[1]
Typical values are only referenced for information. They are subject to change without notice.



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