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STM32WL55JC датащи(PDF) 112 Page - STMicroelectronics

номер детали STM32WL55JC
подробное описание детали  Multiprotocol LPWAN dual core 32-bit Arm® Cortex®-M4/M0 LoRa®, (G)FSK, (G)MSK, BPSK, up to 256KB Flash, 64KB SRAM
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STM32WL55JC датащи(HTML) 112 Page - STMicroelectronics

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Electrical characteristics
STM32WL55/54xx
112/147
DS13293 Rev 2
5.3.15
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3V-capable I/O pins), must be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
case abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating-input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out-of-range parameter: ADC error above a certain limit
(higher than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent
pins (out of the -5 µA/0 µA range) or other functional failure (for example reset occurrence
or oscillator frequency deviation).
The characterization results are given in the table below.
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
5.3.16
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in the table below are derived from tests
performed under the conditions summarized in Table 25: General operating conditions. All
I/Os are designed as CMOS- and TTL-compliant.
Note:
For information on GPIO configuration, refer to the application note STM32 GPIO
configuration for hardware settings and low-power consumption (AN4899).
Table 74. I/O current injection susceptibility(1)
1. Guaranteed by characterization results.
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on all pins except PB0
–5
N/A(2)
2. Injection not possible.
mA
Injected current on PB0 pin
–5
0



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