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FXLS90130 датащи(PDF) 13 Page - NXP Semiconductors

номер детали FXLS90130
подробное описание детали  Single channel inertial sensor
PDF  247 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

FXLS90130 датащи(HTML) 13 Page - NXP Semiconductors

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NXP Semiconductors
FXLS9xxx0
Single channel inertial sensor
Pin
Pin Name
Definition
Description
11
TEST_MISO SPI Data Out
This pin must be left unconnected.
13
VBUF
Power
Supply
This pin is connected to a buffer regulator for the internal circuitry. The buffer
regulator supplies the internal regulators to provide immunity from EMC and
supply dropouts. An external capacitor must be connected between this pin
and VSS as shown in Figure 2, Figure 3, and Figure 4.
15
BUS_I
Supply and
Communication
Receiver
This pin is connected to the supply line and supplies power to the device. An
external filter must be connected between this pin and BUSRTN as shown in
Figure 2, Figure 3, and Figure 4.
16
IDATA
Communication
Transmitter
This pin modulates the response current for DSI3 and PSI5 communication.
An external filter must be connected between this pin and BUSRTN as shown
in Figure 2, Figure 3, and Figure 4.
17
PAD
Die Attach Pad This pin is the die attach flag, and must be connected to VSS. See Section 16
for die attach pad connection details.
Table 10. Device pinout: DSI3 or PSI5 mode pinout...continued
10 Electrical characteristics
Section 10.1 through Section 10.20 contain tables with "Test notes". The note identifiers
cross reference to the identifiers and descriptions found in Table 11.
Identifier Description
*
Indicates critical characteristic.
1
Parameter tested 100 % at final test. Temperature = –40 °C, 25 °C, and 105 °C, VBUS_I
= 7 V, Unless otherwise stated
2
Parameter tested 100 % at final test during safe launch
3
Parameter verified by pass/fail testing at final test
4
Parameter verified by pass/fail testing at final test during safe launch
5
Parameter verified by qualification testing
6
Parameter verified by characterization
7
Functionality verified by modeling, simulation and/or design verification.
8
Circuit integrity assured through IDDQ and scan testing. Timing is determined by
internal system clock frequency.
9
Parameter verified by functional evaluation
10
Thermal resistance provided with device mounted to a 2 layer, 1.6 mm FR4 PCB as
documented in AN1902 with 1 signal layer and 1 ground layer.
11
Digital low-pass filter characteristics are specified independently and do not include g-
cell characteristics. Higher frequency filters will have lower system cut-off frequencies
due to the g-cell damping.
Table 11. Test notes legend
FXLS9xxx0
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
Product data sheet
Rev. 6 — 8 February 2021
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