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ADATE320 датащи(PDF) 21 Page - Analog Devices

номер детали ADATE320
подробное описание детали  1.25 GHz Dual Integrated DCL
PDF  83 Pages
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производитель  AD [Analog Devices]
домашняя страница  http://www.analog.com
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ADATE320 датащи(HTML) 21 Page - Analog Devices

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ADATE320
Data Sheet
Rev. B | Page 20 of 82
Parameter
Min
Typ
Max
Unit
Test
Level
Test Conditions/Comments
ALARM Output Characteristics
Off State Leakage
10
500
nA
P
Disable alarm, apply VDD to ALARM pin, and
measure leakage current
Maximum On Voltage at 200 µA
0.1
0.7
V
P
ALARM pin asserted, force 200 µA into pin and
measure voltage
AC SPECIFICATIONS
Propagation Delay
0.5
µs
CB
For OVDH: VDUTx = 0.0 V to 4.5 V step, OVDH = 4.0 V,
OVDL = −1.0 V; for OVDL: VDUTx = 0.0 V to −1.5 V step,
OVDH = 4.0 V, OVDL = −1.0 V
SERIAL PROGRAMMABLE INTERFACE (SPI) SPECIFICATIONS
Table 13.
Parameter
Min
Typ
Max
Unit
Test
Level
Test Conditions/Comments
DC SPECIFICATIONS
Input Voltage
RST, CS, SCLK, SDI
Logic High
VDD − 0.7
VDD
V
PF
Logic Low
0.0
0.7
V
PF
Input Bias Current
−10
1
+10
µA
P
Tested at 0.0 V and VDD; RST tested at VDD; RST has an internal
50 kΩ pull-up to VDD
SCLK Crosstalk on DUTx Pin
1
mV
CB
DCL disabled, PPMU forcing 0.0 V
Serial Output
Logic High
VDD − 0.5
VDD
V
PF
SDO, sourcing 2 mA
Logic Low
0.0
0.5
V
PF
Sinking 2 mA
BUSY Output Characteristics
Open-drain output
Off State Leakage
10
500
nA
P
BUSY pin not asserted, apply VDD to pin and measure
leakage current
Maximum OnVoltage at 2 mA
0.01
0.7
V
P
BUSY pin asserted, force 2 mA into pin and measure voltage
SPI TIMING SPECIFICATIONS
Table 14.
Parameter
Symbol
Min
Typ
Max
Unit
Test
Level
Description
SCLK Operating Frequency
fCLK
50
MHz
PF
0.5
100
MHz
S
SCLK High Time
tCH
4.5
ns
S
SCLK Low Time
tCL
4.5
ns
S
CS to SCLK Setup at Assert
tCSAS
1.5
ns
S
Setup time of CS assert to next rising edge of SCLK.
CS to SCLK Hold at Assert
tCSAH
1.5
ns
S
Hold time of CS assert to next rising edge of SCLK.
CS to SCLK Setup at
Release
tCSRS
1.5
ns
S
Setup time of CS release to next rising edge of SCLK.
CS to SCLK Hold at Release
tCSRH
1.5
ns
S
Hold time of CS release to next rising edge of SCLK. This parameter
is only critical if the number of SCLK cycles from previous release of
CS is the minimum specified by the tCSAM parameter.
CS Assert to SDO Active
tCSO
0
4
ns
S
Delay time from CS assert to SDO active state.
CS Release to SDO High-Z
tCSZ
0
11
ns
S
Delay from CS release to SDO high-Z state, strongly influenced
by external SDO pin loading.
CS Release to Next Assert
tCSAM
3
Cycles
D
Minimum release time of CS between consecutive assertions of
CS. This parameter is specified in units of SCLK cycles, more
specifically in terms of rising edges of the SCLK input.



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