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TMP93CS41DF датащи(PDF) 13 Page - Toshiba Semiconductor |
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TMP93CS41DF датащи(HTML) 13 Page - Toshiba Semiconductor |
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13 / 48 page ![]() Quality and Reliability Assurance / Handling Precautions 030901 QUA-13 2002-02-20 Table 2.4 Storage conditions, permissible usage Period after unpacking and baking requirements for each soldering method (2/2) Products Name Package no. Air reflow Infrared reflow TMP90PH48F P-QFP80-1420-0.80B A(168h) A(168h) TMP91P642F P-QFP64-1420-1.00A B(72h) B(72h) TMP91C642AF P-QFP64-1420-1.00A A(168h) A(168h) TMP90PM42F P-QFP64-1420-1.00A TMP90PM42DF P-QFP100-2222-0.80A A(168h) A(168h) TMP90CH42F P-QFP100-1420-0.65A A(168h) A(168h) TMP90CH42DF P-QFP100-2222-0.80A A(168h) A(168h) TMP90CK42F P-QFP100-1420-0.65A TMP90CK42DF P-QFP100-2222-0.80A A(168h) A(168h) TMP90PS74DF P-QFP100-2222-0.80A A(168h) A(168h) TMP90CM36T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CM37T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90PM36T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CM38T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CM39T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90PM38T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CS36T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CS37T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90PS36T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CS38T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90CS39T P-QFJ84-S115-1.27 A(168h) A(168h) TMP90PS38T P-QFJ84-S115-1.27 A(168h) A(168h) Note 1: As of September, 2001 Note 2: Ensure that the conditions for top/bottom heating using the long/medium infrared reflow method are strictly adhered to, even when this method is used in combination with the air reflow method. Note 3: Symbols A (168h), B (72h), C (48h), D (24h), E(12h), G and indicate the maximum permissible period between unpacking and mounting of the device, and the required storage conditions for the device. For details of these conditions, please refer to Table 2.2. |
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