SST25PF080B

DS20005137B-page 20

 2014 Microchip Technology Inc.

TABLE 5-5:

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Minimum Specification

Units

Test Method

Endurance

10,000

Cycles

JEDEC Standard A117

Data Retention

100

Years

JEDEC Standard A103

Latch Up

mA

JEDEC Standard 78

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

TABLE 5-6:

AC OPERATING CHARACTERISTICS, 2.3-2.7V

Symbol

Parameter

25 MHz

50 MHz

Units

Min

Max

Min

Max

1. Maximum clock frequency for Read Instruction, 03H, is 25 MHz

Serial Clock Frequency

25

50

MHz

Serial Clock High Time

18

9

ns

Serial Clock Low Time

18

9

ns

Serial Clock Rise Time (Slew Rate)

0.1

0.1

V/ns

Serial Clock Fall Time (Slew Rate)

0.1

0.1

V/ns

3. Relative to SCK.

CE# Active Setup Time

55

ns

CE# Active Hold Time

55

ns

CE# Not Active Setup Time

55

ns

CE# Not Active Hold Time

55

ns

CE# High Time

50

50

ns

CE# High to High-Z Output

15

7

ns

SCK Low to Low-Z Output

00

ns

Data In Setup Time

22

ns

Data In Hold Time

44

ns

HOLD# Low Setup Time

55

ns

HOLD# High Setup Time

55

ns

HOLD# Low Hold Time

55

ns

HOLD# High Hold Time

55

ns

HOLD# Low to High-Z Output

77

ns

HOLD# High to Low-Z Output

77

ns

Output Hold from SCK Change

00

ns

Output Valid from SCK

12

8

ns

Sector-Erase

25

25

ms

Block-Erase

25

25

ms

Chip-Erase

50

50

ms

Byte-Program

10

10

µs

Program Security ID

10

10

µs