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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM8AL3188TCX датащи(PDF) 108 Page - STMicroelectronics |
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STM8AL3188TCX датащи(HTML) 108 Page - STMicroelectronics |
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108 / 131 page  Electrical parameters STM8AL318x STM8AL3L8x 108/131 DocID027179 Rev 6 In the following table, data are based on characterization results, not tested in production. Table 54. DAC accuracy Symbol Parameter Conditions Typ. Max.(1) Unit DNL Differential non linearity(2) RL ≥5 kΩ, CL≤50 pF DACOUT buffer ON(3) 1.5 3 12-bit LSB No load DACOUT buffer OFF 1.5 3 INL Integral non linearity(4) RL ≥5 kΩ, CL≤ 50 pF DACOUT buffer ON(3) 24 No load DACOUT buffer OFF 24 Offset Offset error(5) RL ≥5 kΩ, CL≤ 50 pF DACOUT buffer ON(3) ±10 ±25 No load DACOUT buffer OFF ±5 ±8 Offset1 Offset error at Code 1 (6) DACOUT buffer OFF ±1.5 ±5 Gain error Gain error(7) RL ≥5 kΩ, CL≤ 50 pF DACOUT buffer ON(3) +0.1/-0.2 +0.2/-0.5 % No load DACOUT buffer OFF +0/-0.2 +0/-0.4 TUE Total unadjusted error RL ≥5 kΩ, CL≤ 50 pF DACOUT buffer ON(3) 12 30 12-bit LSB No load -DACOUT buffer OFF 8 12 1. Not tested in production. 2. Difference between two consecutive codes - 1 LSB. 3. In 48-pin package devices the DAC2 output buffer must be kept off and no load must be applied on the DAC_OUT2 output. 4. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code 1023. 5. Difference between the value measured at Code (0x800) and the ideal value = VREF+/2. 6. Difference between the value measured at Code (0x001) and the ideal value. 7. Difference between the ideal slope of the transfer function and the measured slope computed from Code 0x000 and 0xFFF when buffer is ON, and from Code giving 0.2 V and (VDDA -0.2) V when buffer is OFF. |
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