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STM8AL3188TCX датащи(PDF) 89 Page - STMicroelectronics |
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STM8AL3188TCX датащи(HTML) 89 Page - STMicroelectronics |
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89 / 131 page ![]() DocID027179 Rev 6 89/131 STM8AL318x STM8AL3L8x Electrical parameters 117 Flash memory Data memory Table 37. Flash program memory/data EEPROM memory Symbol Parameter Conditions Min. Typ. Max. Unit VDD Operating voltage (all modes, read/write/erase) fSYSCLK = 16 MHz 1.65 - 3.6 V tprog Programming time for 1 or 128 byte (block) erase/write cycles (on programmed byte) -- 6 - ms Programming time for 1 to 128 byte (block) write cycles (on erased byte) -- 3 - ms Iprog Programming/ erasing consumption TA=+25 °C, VDD = 3.0 V - 0.7 - mA TA=+25 °C, VDD = 1.8 V - - Table 38. Flash program memory Symbol Parameter Conditions Min. Max. Unit TWE Temperature for writing and erasing - -40 125 °C NWE Flash program memory endurance (erase/write cycles)(1) TA= 25 °C 1000 - cycles tRET Data retention time TA= 25 °C 40 - years TA= 55 °C 20 - 1. The physical granularity of the memory is 4 byte, so cycling is performed on 4 byte even when a write/erase operation addresses a single byte. Table 39. Data memory Symbol Parameter Conditions Min. Max. Unit TWE Temperature for writing and erasing - -40 125 °C NWE Data memory endurance (erase/write cycles)(1) TA= 25 °C 300 k - cycles TA= -40 to 125 °C 100 k(2) - tRET Data retention time TA= 25 °C 40(2) (3) - years TA= 55 °C 20(2) (3) - 1. The physical granularity of the memory is 4 byte, so cycling is performed on 4 byte even when a write/erase operation addresses a single byte. 2. More information on the relationship between data retention time and number of write/erase cycles is available in a separate technical document. 3. Retention time for 256B of data memory after up to 1000 cycles at 125 °C. |
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