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W97AH6KB датащи(PDF) 19 Page - Winbond |
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W97AH6KB датащи(HTML) 19 Page - Winbond |
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19 / 127 page ![]() W97AH6KB / W97AH2KB Publication Release Date: May 15, 2014 Revision: A01-001 - 19 - 7.3 Mode Register Definition 7.3.1 Mode Register Assignment and Definition Each register is denoted as “R” if it can be read but not written, “W” if it can be written but not read, and “R/W” if it can be read and written. Mode Register Read command shall be used to read a register. Mode Register Write command shall be used to write a register. 7.3.1.1 Mode Register Assignment MR# MA[7:0] Function Access OP7 OP6 OP5 OP4 OP3 OP2 OP1 OP0 0 00H Device Info. R (RFU) RZQI DNVI DI DAI 1 01H Device Feature 1 W nWR (for AP) WC BT BL 2 02H Device Feature 2 W (RFU) RL & WL 3 03H I/O Config-1 W (RFU) DS 4 04H Refresh Rate R TUF (RFU) Refresh Rate 5 05H Basic Config-1 R LPDDR2 Manufacturer ID 6 06H Basic Config-2 R Revision ID1 7 07H Basic Config-3 R Revision ID2 8 08H Basic Config-4 R I/O width Density Type 9 09H Test Mode W Vendor-Specific Test Mode 10 0AH I/O Calibration W Calibration Code 11-15 0BH~0FH (reserved) - (RFU) 16 10H PASR_Bank W Bank Mask 17 11H PASR_Seg W Segment Mask 18-19 12H~13H (Reserved) - (RFU) 20-31 14h–1Fh Reserved for NVM 32 20H DQ Calibration Pattern A R See 7.4.21.2 “DQ Calibration” 33-39 21H~27H (Do Not Use) - 40 28H DQ Calibration Pattern B R See 7.4.21.2 “DQ Calibration” 41-47 29H~2FH (Do Not Use) - 48-62 30H~3EH (Reserved) - (RFU) 63 3FH Reset W X 64-126 40H~7EH (Reserved) - (RFU) 127 7FH (Do Not Use) - 128-190 80H~BEH (Reserved for Vendor Use) - (RFU) 191 BFH (Do Not Use) - 192-254 C0H~FEH (Reserved for Vendor Use) - (RFU) 255 FFH (Do Not Use) - Notes: 1. RFU bits shall be set to ‘0’ during Mode Register writes. 2. RFU bits shall be read as ‘0’ during Mode Register reads. 3. All Mode Registers that are specified as RFU or write-only shall return undefined data when read and DQS shall be toggled. 4. All Mode Registers that are specified as RFU shall not be written. 5. Writes to read-only registers shall have no impact on the functionality of the device. |
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