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80VA датащи(PDF) 21 Page - Lattice Semiconductor |
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80VA датащи(HTML) 21 Page - Lattice Semiconductor |
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21 / 27 page ![]() 21 Specifications ispGDX80VA Boundary Scan The ispGDXVA devices provide IEEE1149.1a test capa- bility and ISP programming through a standard Boundary Scan Test Access Port (TAP) interface. The boundary scan circuitry on the ispGDXVA Family operates independently of the programmed pattern. This allows customers using boundary scan test to have full test capability with only a single BSDL file. The ispGDXVA devices are identified by the 32-bit JTAG IDCODE register. The device ID assignments are listed in Table 4. Table 3. I/O Shift Register Order Figure 10. Boundary Scan Register Circuit for I/O Pins Normal Function OE EXTEST Update DR SCANOUT (to next cell) Clock DR SCANIN (from previous cell Shift DR Normal Function TOE DQ DQ DQ DQ DQ I/O Pin Reset BSCAN Registers BSCAN Latches HIGHZ 0 1 0 1 PROG_MODE EXTEST I/O Shift Reg Order/ispGDXVA ispGDX80VA TDI, TOE, RESET, Y1, Y0, I/O B10 .. B19, I/O C0 .. C19, I/O D0 .. D9, I/O B9 .. B0, I/O A19.. A0, I/O D19 .. D10, TDO I/O SHIFT REGISTER ORDER DEVICE Table 4. ispGDX80VA Device ID Codes ID Code/GDX80VA ispGDX80VA 0001, 0000, 0011, 0101, 0000, 0000, 0100, 0011 32-BIT BOUNDARY SCAN ID CODE DEVICE |
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