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80VA датащи(PDF) 20 Page - Lattice Semiconductor |
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80VA датащи(HTML) 20 Page - Lattice Semiconductor |
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20 / 27 page ![]() 20 Specifications ispGDX80VA Figure 9. ispJTAG Device Programming Interface In-System Programmability All necessary programming of the ispGDXVA is done via four TTL level logic interface signals. These four signals are fed into the on-chip programming circuitry where a state machine controls the programming. On-chip programming can be accomplished using an IEEE 1149.1 boundary scan protocol. The IEEE 1149.1- compliant interface signals are Test Data In (TDI), Test Data Out (TDO), Test Clock (TCK) and Test Mode Select (TMS) control. The EPEN pin is also used to enable or disable the JTAG port. The embedded controller port enable pin (EPEN) is used to enable the JTAG tap controller and in that regard has similar functionality to a TRST pin. When the pin is driven high, the JTAG TAP controller is enabled. This is also true when the pin is left unconnected, in which case the pin is pulled high by the permanent internal pullup. This allows ISP programming and BSCAN testing to take place as specified by the Instruction Table. When the pin is driven low, the JTAG TAP controller is driven to a reset state asynchronously. It stays there while the pin is held low. After pulling the pin high the JTAG controller becomes active. The intent of this fea- ture is to allow the JTAG interface to be directly controlled by the data bus of an embedded controller (hence the name Embedded Port Enable). The EPEN signal is used as a “device select” to prevent spurious programming and/or testing from occuring due to random bit patterns on the data bus. Figure 9 illustrates the block diagram for the ispJTAG interface. ispGDX 80VA Device TDO TDI TMS TCK EPEN ispJTAG Programming Interface ispLSI Device ispMACH Device ispGDX 80VA Device ispGDX 80VA Device |
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