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LPC2131 датащи(PDF) 32 Page - NXP Semiconductors |
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LPC2131 датащи(HTML) 32 Page - NXP Semiconductors |
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32 / 45 page ![]() LPC2131_32_34_36_38 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 5.1 — 29 July 2011 32 of 45 NXP Semiconductors LPC2131/32/34/36/38 Single-chip 16/32-bit microcontrollers 10. ADC electrical characteristics [1] Conditions: VSSA =0V, VDDA =3.3 V. [2] The ADC is monotonic, there are no missing codes. [3] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 11. [4] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after appropriate adjustment of gain and offset errors. See Figure 11. [5] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the ideal curve. See Figure 11. [6] The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset error, and the straight line which fits the ideal transfer curve. See Figure 11. [7] The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated ADC and the ideal transfer curve. See Figure 11. [8] See Figure 11. Table 8. ADC static characteristics VDDA = 2.5 V to 3.6 V; Tamb = 40 C to +85 C unless otherwise specified; ADC frequency 4.5 MHz. Symbol Parameter Conditions Min Typ Max Unit VIA analog input voltage 0 - VDDA V Cia analog input capacitance - - 1 pF ED differential linearity error [1][2][3] -- 1LSB EL(adj) integral non-linearity [1][4] -- 2LSB EO offset error [1][5] -- 3LSB EG gain error [1][6] -- 0.5 % ET absolute error [1][7] -- 4LSB Rvsi voltage source interface resistance [8] --40 k |
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