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LPC2131 датащи(PDF) 31 Page - NXP Semiconductors |
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LPC2131 датащи(HTML) 31 Page - NXP Semiconductors |
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31 / 45 page ![]() LPC2131_32_34_36_38 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 5.1 — 29 July 2011 31 of 45 NXP Semiconductors LPC2131/32/34/36/38 Single-chip 16/32-bit microcontrollers Test conditions: Idle mode entered executing code from flash; all peripherals are enabled in PCONP register; PCLK = CCLK/4. (1) VDD = 3.6 V at 140 C (max) (2) VDD = 3.6 V at 60 C (3) VDD = 3.6 V at 25 C (4) VDD = 3.3 V at 25 C (typical) (5) VDD = 3.3 V at 95 C (typical) Fig 9. IDD idle measured at different frequencies (CCLK) and temperatures frequency (MHz) 0 60 (1) (2) (3) (4) (5) 40 20 10 50 30 002aab403 5 10 15 0 IDD (mA) Test conditions: Power-down mode entered executing code from flash; all peripherals are enabled in PCONP register. (1) VDD = 3.6 V (2) VDD = 3.3 V (max) (3) VDD = 3.0 V (4) VDD = 3.3 V (typical) Fig 10. IDD(pd) measured at different temperatures 002aab405 200 300 100 400 500 0 temp °(C) −60 140 100 20 60 −20 IDD (μA) (1) (2) (3) (4) |
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