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HT16C21 датащи(PDF) 5 Page - Holtek Semiconductor Inc |
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HT16C21 датащи(HTML) 5 Page - Holtek Semiconductor Inc |
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5 / 34 page ![]() Rev. 1.00 5 November 22, 2011 HT16C21 Pin Description Pin Name Type Description SDA I/O Serial data input/output for I2C interface SCL I Serial clock input for I2C interface VDD — Positive power supply. VSS — Negative power supply, ground. VLCD — ● One external resistor is connected between the VLCD pin and the VDD pin to determine the bias voltage for the package with a VLCD pin. Internal voltage adjustment function is disabled. ● Internal voltage adjustment function can be used to adjust the VLCD voltage. If the VLCD pin is used as voltage detection pin, an external power supply should not be applied to the VLCD pin. ● An external MCU can detect the voltage of the VLCD pin and program the internal voltage adjustment for the packages with a VLCD pin. COM0~COM3 O LCD common outputs. COM4/SEG0~COM7/SEG3 O LCD common/segment multiplexed driver outputs SEG4~SEG19 O LCD segment outputs. Approximate Internal Connections VDD VSS SCL, SDA (for schmit Trigger type) Vselect-on Vselect-off COM0~COM7; SEG0~SEG19 Absolute Maximum Ratings Supply voltage ......................................................................................................................VSS−0.3V to VSS+6.5V Input voltage ........................................................................................................................VSS−0.3V to VDD+0.3V Storage temperature .......................................................................................................................-55°C to +150°C Operating temperature .....................................................................................................................-40°C to +85°C Note: These are stress ratings only. Stresses exceeding the range specified under "Absolute Maximum Ratings" may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability. |
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