Analog Integrated Circuit Device Data

Freescale Semiconductor

9

33781

ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

Table 4. Dynamic Electrical Characteristics

Characteristics noted under conditions 4.75V

noted. Voltages relative to GND, unless otherwise noted. Typical values noted reflect the approximate mean values of the

Characteristic

Symbol

Min

Typ

Max

Unit

CLOCK

CLK Periods (System requirement)(10)

Time High

Time Low

Period

75

75

245

–

–

250

–

–

255

ns

CLK Transition (System requirement)(10)

Time for Low-to-High Transition of the CLK Input Signal

Time for High-to-Low Transition of the CLK Input Signal

–

–

–

–

100

100

ns

Reset Low Time

100

–

–

ns

SPI INTERFACE TIMING

SPI Clock Cycle Time

100

–

–

ns

SPI Clock High Time

40

–

–

ns

SPI Clock Low Time

40

–

–

ns

SPI CSn Lead Time(11)

50

–

–

ns

SPI CSn Lag Time(11)

50

–

–

ns

SPI CS0 Time Between Bursts(10)

80

–

–

ns

SPI CS1 Time Between Bursts(10)

300

–

–

ns

Data Setup Time

MOSI0 Valid Before SCLK0 Rising Edge(11)

10

–

–

ns

Data Hold Time

MOSI0 Valid After SCLK0 Rising Edge(11),(10)

10

–

–

ns

Data Valid Time

SCLKn Falling Edge to MISOn Valid, C = 50pF(12)

–

–

25

ns

Output Disable Time

CSn

Rise to MISOn Hi-Z

–

–

50

ns

(10)

SCLKn, MOSI0

–

–

10

ns

SCLKn, MOSI0

–

–

10

ns

Notes

10.

Not measured in production.

11.

SPI signal timing from the production test equipment is programmed to ensure compliance.

12.

Conditions are verified indirectly during test.