MSC8156 datasheet(25/68 Pages) FREESCALE

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Electrical Characteristics

MSC8156 Six-Core Digital Signal Processor Data Sheet, Rev. 1

Freescale Semiconductor

2.3

Thermal Characteristics

Table 4 describes thermal characteristics of the MSC8156 for the FC-PBGA packages.

2.4

CLKIN Requirements

Table 5 summarizes the required characteristics for the CLKIN signal.

2.5

DC Electrical Characteristics

This section describes the DC electrical characteristics for the MSC8156.

2.5.1

DDR SDRAM DC Electrical Characteristics

This section describes the DC electrical specifications for the DDR SDRAM interface of the MSC8156.

Note:

DDR2 SDRAM uses VDDDDR(typ) = 1.8 V and DDR3 SDRAM uses VDDDDR(typ) = 1.5 V.

Table 4. Thermal Characteristics for the MSC8156

Characteristic

Symbol

FC-PBGA

× 29 mm2

Unit

Natural

Convection

200 ft/min

(1 m/s) airflow

Junction-to-ambient1, 2

RθJA

°C/W

Junction-to-ambient, four-layer board1, 2

RθJA

°C/W

Junction-to-board (bottom)3

RθJB

°C/W

Junction-to-case4

RθJC

0.6

°C/W

Notes:

Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)

temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal

resistance.

Junction-to-ambient thermal resistance determined per JEDEC JESD51-3 and JESDC51-6. Thermal test board meets JEDEC

specification for the specified package.

Junction-to-board thermal resistance determined per JEDEC JESD 51-8. Thermal test board meets JEDEC specification for

the specified package.

Junction-to-case at the top of the package determined using MIL- STD-883 Method 1012.1. The cold plate temperature is used

for the case temperature. Reported value includes the thermal resistance of the interface layer

Table 5. CLKIN Requirements

Parameter/Condition1

Symbol

Min

Typ

Max

Unit

Notes

CLKIN duty cycle

—

CLKIN slew rate

—

V/ns

CLKIN peak period jitter

—

±150

—

CLKIN jitter phase noise at –56 dBc

—

500

KHz

AC input swing limits

ΔVAC

1.5

—

Input capacitance

CIN

——

—

Notes:

For clock frequencies, see the Clock chapter in the MSC8156 Reference Manual.

Measured at the rising edge and/or the falling edge at VDDIO/2.

Slew rate as measured from ±20% to 80% of voltage swing at clock input.

Phase noise is calculated as FFT of TIE jitter.

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