Production Data

WM2633

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 July 1999

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to

damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of

this device.

CONDITION

MIN

MAX

Digital supply voltages, AVDD or DVDD to GND

7V

Supply voltage differences, AVDD to DVDD

-2.8V

2.8V

Reference input voltage

-0.3V

AVDD + 0.3V

Digital input voltage range to GND

-0.3V

DVDD + 0.3V

WM2633CDT

WM2633IDT

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

AVDD,

DVDD

2.7

5.5

V

High-level digital input voltage

See Note 1

2

V

Low-level digital input voltage

See Note 1

0.8

V

Reference voltage to REF

See Note 1

AVDD - 1.5

V

Load resistance

2k

Ω

Load capacitance

100

pF

WM2633CDT

0

70

°C

Operating free-air temperature

WM2633IDT

-40

85

°C

Note: Reference input voltages greater than AVDD/2 will cause saturation for large DAC codes.