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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M306V2EEFS датащи(PDF) 248 Page - Renesas Technology Corp |
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M306V2EEFS датащи(HTML) 248 Page - Renesas Technology Corp |
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248 / 271 page  Rev.1.40 Oct 06, 2004 page 248 of 269 M306V2ME-XXXFP, M306V2EEFP 3.10 Built-in PROM Version 3.10.1 All Built-in PROM Versions High voltage is required to program to the built-in PROM. Be careful not to apply excessive voltage. Be especially careful during power-on. 3.10.2 One Time PROM Version One Time PROM versions shipped in blank, of which built-in PROMs are programmed by users, are also provided. For these microcomputers, a programming test and screening are not performed in the as- sembly process and the following processes. To improve their reliability after programming, we recom- mend to program and test as flow shown in Figure 3.10.1 before use. Figure 3.10.1 Programming and test flow for One Time PROM version Programming with PROM programmer Screening (Note) (Leave at 150˚C for 40 hours) Verify test PROM programmer Function check in target device Note: Never expose to 150˚C exceeding 100 hours. |
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