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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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56F827 датащи(PDF) 49 Page - Freescale Semiconductor, Inc |
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56F827 датащи(HTML) 49 Page - Freescale Semiconductor, Inc |
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49 / 60 page  JTAG Timing 56F827 Technical Data, Rev. 12 Freescale Semiconductor 49 3.14 JTAG Timing Figure 3-30 Test Clock Input Timing Diagram Table 3-18 JTAG Timing1, 3 Operating Conditions: VSSIO = VSS = VSSA = 0V, VDDA = VDDIO = 3.0–3.6V, VDD = 2.25–2.75V, TA = –40° to +85°C, CL ≤ 50pF, fop = 80MHz 1. Timing is both wait state and frequency dependent. For the values listed, T = clock cycle. For 80MHz operation, T = 12.5ns. Characteristic Symbol Min Max Unit TCK frequency of operation2 2. TCK frequency of operation must be less than 1/8 the processor rate. 3. Parameters listed are guaranteed by design. fOP DC 10 MHz TCK cycle time tCY 100 — ns TCK clock pulse width tPW 50 — ns TMS, TDI data set-up time tDS 0.4 — ns TMS, TDI data hold time tDH 1.2 — ns TCK low to TDO data valid tDV — 26.6 ns TCK low to TDO tri-state tTS — 23.5 ns TRST assertion time tTRST 50 — ns DE assertion time tDE 4T — ns TCK (Input) VM VIL VM = VIL + (VIH – VIL)/2 VM VIH tPW tCY tPW |
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