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MAXQ3180-RAN+ датащи(PDF) 34 Page - Maxim Integrated Products |
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MAXQ3180-RAN+ датащи(HTML) 34 Page - Maxim Integrated Products |
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34 / 48 page ![]() Note that analog scan slot 7 is reserved for temperature measurements. There is no need to explicitly enable this measurement slot, since it is automatically activat- ed when either the TMPC0 (single temperature mea- surement command) or TMPC1 (double temperature measurement command) bits are set by the master. The required time for a each analog scan slot measure- ment (tC) is determined by the MAXQ3180 system clock frequency, the setting of the ADC clock division bits (ADCCD0 and ADCCD1) in the R_ACFG hardware register, and the setting of the R_ADCRATE hardware register, as shown in Table 7. Using the default register settings (ADCCD[1:0] = 00b and ADCRATE = C7h = 199d), the time for each analog slot measurement (tC) is 25μs when the MAXQ3180 is running at 8MHz. Since there are eight analog scan slots in the measurement frame, the total time for all measurements (tF) is tC x 8. Using the default settings with the MAXQ3180 running at 8MHz, the entire sequence of measurements takes 200μs to complete, which, in turn, means that 200μs will elapse, for exam- ple, between one phase A current measurement and the next. Even if some of the analog measurement slots (such as neutral current or temperature measurement) are skipped by setting the NOCONV bit in that slot’s SCAN_x register to 1, the time period for that slot will remain in the frame, ensuring that the total frame time is always tC x 8, regardless of which individual slots are enabled or disabled. Digital Processing As voltage and current samples are collected, the MAXQ3180 performs a variety of digital filtering, accu- mulation, and processing calculations to arrive at meter-reading values (such as line frequency, RMS voltage and current, and active and reactive power) that can then be read by the master. The MAXQ3810 calculates and detects values and conditions including the following: • Zero-crossing detection • Line frequency and line period calculation • RMS voltage (phase A, phase B, phase C) • RMS current (phase A, phase B, phase C, neutral current) • Power (active, reactive, and apparent) for each phase • Energy accumulation (including energy pulse output function) • Peak voltage (phase A, phase B, phase C) • Peak current (phase A, phase B, phase C) • Voltage sag condition • Tamper condition detection Voltage Zero-Crossing Detection The MAXQ3180 monitors each of the three voltage input signals (from phase A, phase B, and phase C) and detects zero-crossing events on each of them indi- vidually. The sequence of the detected zero crossings and the intervals between them are then used to calcu- late additional data. Before zero-crossing detection is performed, each of the three voltage inputs (VA, VB, and VC) are passed through a first-order lowpass filter (LPF) with a cutoff frequency near 50Hz to reduce harmonics, which can trigger false zero-crossing events. The master can con- figure this LPF by setting the register LPF_B0FZC. The equation for the zero-crossing LPF (for all three voltage phase inputs) is as follows: Yn = Yp + (Xn - Yp) x LPF_B0FZC/216 Although the filtered waveform output is not a perfect sine wave, the LPF ensures that the output has no more than one ascending zero crossing per line period. Following the LPF filter processing stage, the MAXQ3180 scans the voltage signals to detect ascend- ing zero-crossing events for each voltage phase. Line Frequency and Period Measurement For each phase A, B, and C, the MAXQ3180 counts the number of scan frames (NS) between two consecutive zero crossings. The NS is a global value, common for all three phases, and is located in RAM at address 0x08C. Each individual phase A, B, or C zero-crossing event contributes raw NS count, which plugs as input to the LPF. Low-Power, Multifunction, Polyphase AFE 34 ______________________________________________________________________________________ Table 7. Analog Scan Slot Time Selection ADCCD1 ADCCD0 ADC CLOCK DIVISION RATE ANALOG SCAN SLOT TIME (tC) 0 0 Divide by 1 (default) 1/fCLK x (R_ADCRATE[8:0] + 1) 0 1 Divide by 2 2/fCLK x (R_ADCRATE[8:0] + 1) 1 0 Divide by 4 4/fCLK x (R_ADCRATE[8:0] + 1) |
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