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LP85571 датащи(PDF) 19 Page - Texas Instruments

номер детали LP85571
подробное описание детали  LP8557 High-Efficiency LED Backlight Driver For Tablets
PDF  49 Pages
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производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
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LP85571 датащи(HTML) 19 Page - Texas Instruments

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Duty cycle D = 1 - VIN / VOUT
tSW = 1 / fSW
Slew rate control,
programmable
Spread spectrum scheme,
programmable pseudo
random duty cycle changes
minimize EMI
LP8557, LP85571
www.ti.com
SNVSA15B – DECEMBER 2013 – REVISED DECEMBER 2015
Feature Description (continued)
8.3.5 EMI Reduction Schemes
LP8557I features two EMI reduction schemes. By default, the schemes are disabled; however, the schemes can
be enabled by I2C writes to SSEN and SREN bits in COMMAND register. The schemes are unavailable on the
LP8557.
The first scheme, programmable slew rate control, uses a combination of three drivers for boost switch. Enabling
all three drivers allows boost switch on/off transition times to be the shortest. On the other hand, enabling just
one driver allows boost switch on/off transition times to be the longest. The longer the transition times, the lower
the switching noise on the SW terminal. It should also be noted that the shortest transition times bring the best
efficiency as the switching losses are the lowest. This scheme can be enabled by setting SREN=1 with an I2C
write.
The second EMI reduction scheme is the spread spectrum scheme. This scheme deliberately spreads the
frequency content of the boost switching waveform, which inherently has a narrow bandwidth, makes the
switching waveform's bandwidth wider and ultimately reduces its EMI spectral density. This scheme can be
enabled by setting SSEN = 1 with an I2C write.
Figure 32. EMI Reduction Schemes
8.3.6 Fault Detection
The LP8557 and LP8557I have fault detection for LED SHORT, UVLO, BST_OVP, BST_OCP, BST_UV, and
TSD. Additionally, the LP8557I can support LED OPEN* fault. Faults are recorded in the STATUS register. Each
time the STATUS register is read it is automatically cleared.
8.3.6.1 LED Short Detection
Voltages at the individual current sinks are constantly monitored for the LED SHORT fault. This fault may occur
when some LEDs in a string are electrically bypassed making that LED string shorter than the other LED strings.
The reduced forward voltage causes the current sink attached to that string to have a higher headroom voltage
than the other current sinks. When the headroom voltage is higher than the fault comparator threshold
(configured with the 0V field in the LEDEN register), that current sink is disabled, and the PWM phasing is
automatically adjusted. The fault comparator threshold is at 2 V, typical.
8.3.6.2 LED OPEN* Detection
When the auto-detect function is disabled, each current sink is also monitored for the LED OPEN* condition. The
condition is set when the headroom voltage on one or more current sinks is below the LOW comparator
threshold, and the boost voltage is at the maximum. This fault condition may be caused by one or more OPEN
LED strings or by one or more current sinks shorted to GND. The LP8557I immediately shuts down the backlight
whenever an LED OPEN* condition is detected on any enabled LED drivers. The backlight does not turn on
again (regardless of the COMMAND.ON bit) until the STATUS register is read.
8.3.6.3 Undervoltage Detection
The device continuously monitors the voltage on the VDD pin. When the VDD voltage drops below 2.5 V the
backlight is immediately shut down, and the UVLO bit is set in the STATUS register. The backlight automatically
starts again when the voltage has increased above 2.5 V + 50 mV hysteresis. Hysteresis is implemented to avoid
continuously triggering undervoltage.
Copyright © 2013–2015, Texas Instruments Incorporated
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Product Folder Links: LP8557 LP85571



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