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LP85571 датащи(PDF) 19 Page - Texas Instruments |
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LP85571 датащи(HTML) 19 Page - Texas Instruments |
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19 / 49 page ![]() Duty cycle D = 1 - VIN / VOUT tSW = 1 / fSW Slew rate control, programmable Spread spectrum scheme, programmable pseudo random duty cycle changes minimize EMI LP8557, LP85571 www.ti.com SNVSA15B – DECEMBER 2013 – REVISED DECEMBER 2015 Feature Description (continued) 8.3.5 EMI Reduction Schemes LP8557I features two EMI reduction schemes. By default, the schemes are disabled; however, the schemes can be enabled by I2C writes to SSEN and SREN bits in COMMAND register. The schemes are unavailable on the LP8557. The first scheme, programmable slew rate control, uses a combination of three drivers for boost switch. Enabling all three drivers allows boost switch on/off transition times to be the shortest. On the other hand, enabling just one driver allows boost switch on/off transition times to be the longest. The longer the transition times, the lower the switching noise on the SW terminal. It should also be noted that the shortest transition times bring the best efficiency as the switching losses are the lowest. This scheme can be enabled by setting SREN=1 with an I2C write. The second EMI reduction scheme is the spread spectrum scheme. This scheme deliberately spreads the frequency content of the boost switching waveform, which inherently has a narrow bandwidth, makes the switching waveform's bandwidth wider and ultimately reduces its EMI spectral density. This scheme can be enabled by setting SSEN = 1 with an I2C write. Figure 32. EMI Reduction Schemes 8.3.6 Fault Detection The LP8557 and LP8557I have fault detection for LED SHORT, UVLO, BST_OVP, BST_OCP, BST_UV, and TSD. Additionally, the LP8557I can support LED OPEN* fault. Faults are recorded in the STATUS register. Each time the STATUS register is read it is automatically cleared. 8.3.6.1 LED Short Detection Voltages at the individual current sinks are constantly monitored for the LED SHORT fault. This fault may occur when some LEDs in a string are electrically bypassed making that LED string shorter than the other LED strings. The reduced forward voltage causes the current sink attached to that string to have a higher headroom voltage than the other current sinks. When the headroom voltage is higher than the fault comparator threshold (configured with the 0V field in the LEDEN register), that current sink is disabled, and the PWM phasing is automatically adjusted. The fault comparator threshold is at 2 V, typical. 8.3.6.2 LED OPEN* Detection When the auto-detect function is disabled, each current sink is also monitored for the LED OPEN* condition. The condition is set when the headroom voltage on one or more current sinks is below the LOW comparator threshold, and the boost voltage is at the maximum. This fault condition may be caused by one or more OPEN LED strings or by one or more current sinks shorted to GND. The LP8557I immediately shuts down the backlight whenever an LED OPEN* condition is detected on any enabled LED drivers. The backlight does not turn on again (regardless of the COMMAND.ON bit) until the STATUS register is read. 8.3.6.3 Undervoltage Detection The device continuously monitors the voltage on the VDD pin. When the VDD voltage drops below 2.5 V the backlight is immediately shut down, and the UVLO bit is set in the STATUS register. The backlight automatically starts again when the voltage has increased above 2.5 V + 50 mV hysteresis. Hysteresis is implemented to avoid continuously triggering undervoltage. Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 19 Product Folder Links: LP8557 LP85571 |
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