LP5523 datasheet(36/61 Pages) TI2

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LP5523

SNVS550E – SEPTEMBER 2009 – REVISED JANUARY 2017

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40 TEMPERATURE WRITE

•

40 — Bits [7:0] TEMPERATURE

–

These bits are used for storing an 8-bit temperature reading acquired from an external sensor, if such a

sensor is used. Temperature reading is stored in 8-bit two's complement format, like in 3F

TEMPERATURE READ register.

NOTE

When writing temperature data outside the range of the temperature compensation:

Values greater than 89°C are set to 89°C; values less than

−39°C are set to −39°C.

41 LED TEST CONTROL

•

LED test control register

–

41 — Bit [7] EN_LEDTEST_ADC

–

Writing this bit high (1) fires single LED test conversion. LED test measurement cycle is 2.7 milliseconds.

•

41 — Bit [6] EN_LEDTEST_INT

–

1 = interrupt signal is sent to the INT pin when the LED test is accomplished.

–

0 = no interrupt signal is sent to the INT pin when the LED test is accomplished.

–

Interrupt can be cleared by reading STATUS/INTERRUPT register 3A.

•

41 — Bit [5] CONTINUOUS_CONV

–

1 = continuous LED test measurement. Not active in power-save mode.

–

0 = continuous conversion is disabled.

•

41 — Bits [4:0] LED__TEST_CTRL

–

These bits are used for choosing the LED driver output to be measured. VDD, INT-pin, and charge-pump

output voltage can be measured, also.

LED_TEST_CTRL BITS

MEASUREMENT

00000

00001

00010

00011

00100

00101

00110

00111

01000

01001 to 01110

Reserved

01111

VOUT

10000

VDD

10001

INT-pin voltage

10010 to 11111

N/A

42 LED TEST ADC

•

42 — Bits [7:0] LED_TEST_ADC

–

This is used to store the LED test result. Read-only register. LED test ADC's least significant bit

corresponds to 30 mV. The measured voltage V (typical) is calculated as follows: V = (RESULT(DEC) ×

0.03 – 1.478 V. For example, if the result is 10100110 = 166(DEC), the measured voltage is 3.5 V

(typical). See Figure 24.

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