ST25R200 datasheet(69/88 Pages) STMICROELECTRONICS

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5.15.17

Test register access

This command allows access to the device’s test registers.

Test registers are not part of the normal register address space. After sending the direct command, test registers

can be accessed using the normal Read/Write register operation.

The access to test registers is possible in a chained command sequence where command test register access is

sent first, followed by read/write operation to test registers. The test registers are set to the default state at power-

up.

Test and observation register 1

Address: 02h

Type: RW

Domain: PD

Table 84. Observation access 1

Bit

Name

Default

Function

Comment

tm_rxwu_tad2_3

TAD2 test mode

Table 85

tm_rxwu_tad2_2

tm_rxwu_tad2_1

tm_rxwu_tad2_0

tm_rxwu_tad1_3

TAD1 test mode

tm_rxwu_tad1_2

tm_rxwu_tad1_1

tm_rxwu_tad1_0

Table 85. TAD1/TAD2 test mode

tm_rxwu_tad<3:0>

tm_rxwu_tad3

tm_rxwu_tad2

tm_rxwu_tad1

tm_rxwu_tad0

Mode

Digital

Other combinations

RFU

Test and observation register 2

Address: 03h

Type: RW

Domain: PD

Table 86. Observation register 2

Bit

Name

Default

Function

Comment

tm_sigsel_tad2_3

TAD2 test signal

Table 87 and Table 88

tm_sigsel_tad2_2

tm_sigsel_tad2_1

tm_sigsel_tad2_0

tm_sigsel_tad1_3

TAD1 test signal

tm_sigsel_tad1_2

tm_sigsel_tad1_1

tm_sigsel_tad1_0

ST25R200

Application information

DS13658 - Rev 2

page 69/88

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