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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M700000002 датащи(PDF) 63 Page - SPANSION |
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M700000002 датащи(HTML) 63 Page - SPANSION |
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63 / 128 page  November 25, 2003 Am70PDL127BDH/Am70PDL129BDH 61 AD VAN C E INFORM ATION TEST CONDITIONS Table 19. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Note: Diodes are IN3064 or equivalent Figure 10. Test Setup, V IO = 2.7 – 3.3 V Test Condition 66, 85 Unit Output Load 1 TTL gate Output Load Capacitance, C L (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input Figure 11. Input Waveforms and Measurement Levels |
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