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THS1230CPWR датащи(PDF) 17 Page - Texas Instruments |
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THS1230CPWR датащи(HTML) 17 Page - Texas Instruments |
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17 / 22 page ![]() www.ti.com AGND 1 CON1 2 CON0 3 EXTREF 4 AIN+ 5 AIN− 6 AGND 7 AVDD 8 REFT 9 REFB 10 OVRNG 11 D11 12 D10 13 D9 14 D8 15 D7 16 D6 17 D5 18 DGND 19 DVDD 20 D4 21 D3 22 D2 23 D1 24 D0 25 OE 26 CLKVDD 27 CLK 28 U1 THS1230PW +3.3VA +3.3VD +3.3VA ADCCLK OEB CON0 CON1 EXTREF VINP VINM ADCCLK OEB CON0 CON1 EXTREF VINM D4 10 D5 9 D6 8 D7 7 D8 6 D9 5 D10 4 D11 3 D12 2 D13 1 CLK 28 MODE 25 DVDD 27 DGND 26 AGND 20 AVDD 24 EXTLO 16 REFIO 17 FSADJ 18 COMP1 19 COMP2 23 IOUT1 22 IOUT2 21 SLEEP 15 D3 11 D2 12 D1 13 D0 14 U3 THS5671AIPW LNK3 LNK2 LNK4 LNK5 R2 47K R23 47K R1 47K R24 47K +3.3VD +3.3VD +3.3VD +3.3VD OEB EXTREF CON1 CON0 CON0 TP1 TP2 C28 10uF C27 0.1uF C25 0.1uF C26 0.1uF VRT VRB VRT VRB C62 470pF C63 0.1uF C64 470pF C65 0.1uF C66 470pF C67 0.1uF +3.3VD _3.3VA ADCOVRNG ADCD00 ADCD01 ADCD02 ADCD03 ADCD04 ADCD05 ADCD06 ADCD07 ADCD08 ADCD09 ADCD10 ADCD11 ADCD [00:11] +3.3VA +3.3VD ADCDB00 ADCDB01 ADCDB02 ADCDB03 ADCDB04 ADCDB05 ADCDB06 ADCDB07 ADCDB08 ADCDB09 ADCDB10 ADCDB11 ADCDB[00:11] DACCLK DACCLK C6 0.1uF C15 0.1uF +3.3VA IOUT1 IOUT2 R10 2K C16 0.01uF C5 0.1uF C19 10uF C17 0.1uF C18 0.1uF +3.3VD +3.3VA CON1 OEB EXTREF IOUT1 IOUT2 + VINP DEFINITIONS OF SPECIFICATIONS AND TERMINOLOGY Integral Nonlinearity (INL) Differential Nonlinearity (DNL) Offset and Gain Error THS1230 SLAS291B – OCTOBER 2000 – REVISED MARCH 2004 Figure 22. EVM Schematic Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero through full scale. The point used as zero occurs 1/2 LSB before the first code transition. The full-scale point is defined as level 1/2 LSB beyond the last code transition. The deviation is measured from the center of each particular code to the true straight line between these two end-points. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore, this measure indicates how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under test, i.e. (last transition level - first transition level)/(2n –2). Using this definition for DNL separates the effects of gain and offset error. A minimum DNL better than –1 LSB ensures no missing codes. Offset error (in LSBs) is defined as the average offset for all inputs, and gain error is defined as the maximum error (in LSBs) caused by the angular deviation from the offset corrected straight line. 17 |
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