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ELECTRICAL CHARACTERISTICS

THS1230

SLAS291B – OCTOBER 2000 – REVISED MARCH 2004

over recommended operating conditions (AV

internal reference, T

DIGITAL INPUTS AND OUTPUTS (ALL SUPPLIES = 3.3 V)

PARAMETER

TEST CONDITION

MIN

TYP

MAX

UNIT

DIGITAL INPUTS

All other inputs

0.8

× DV

DD

High level input voltage

V

CLK

0.8

× AV

DD

All other inputs

0.2

× DV

DD

Low level input voltage

V

CLK

0.2

× AV

DD

High level input current

1

µA

Low level input current

–1

µA

Input capacitance

5

pF

DIGITAL OUTPUTS

High level output voltage

V

Low level output voltage

0.4

High impedance output current

±1

µA

Rise/fall time

4.5

ns

ANALOG INPUTS

Switched input capacitance

6

pF

Aperture delay time

2

ns

Aperture uncertainty (jitter)

2

ps

DC leakage current (input =

±FS)

10

µA

POWER SUPPLY (CLK = 30 MHz)

Supply voltage (all supplies)

3

3.3

3.6

V

Supply current active - total

48

66

Supply current active - analog

35

mA

Supply current active - digital

13

Standby supply current

CLK = 0 MHz

10

µA

770

µs

Power-up time for references from standby

6.2

ms

Power-up time for valid ADC conversions

720

ns

168

220

Power dissipation

mW

188

Standby power dissipation

CLK = 0 MHz

36

µW

PSRR

Power supply rejection ratio

±0.1

%FS

(1)

Time for reference to recover to 1% of its final voltage level.

(2)

Time for ADC conversions to be accurate to within 0.1% of fullscale, INT ckts.

(3)

Clock = 30 MHz, AIN+ and AIN– at Common Mode or 1.65 V DC.

(4)

Clock = 30 MHz, fin = 3.58 MHz at –1 dBFS.

5