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PM8805 датащи(PDF) 17 Page - STMicroelectronics |
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PM8805 датащи(HTML) 17 Page - STMicroelectronics |
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17 / 48 page ![]() DS12813 Rev 2 17/48 PM8805 Electrical specifications 48 Iinrush_high Inrush current high value Sourced by VOUT when VOB- VOUT=7V 95 125 155 mA Iinrush_ave Average inrush current VOUT=0V to 57V 75 mA Inrush_delay Iinrush startup delay From UVLO release 1 ms Iload_inrush Load current capability during inrush VOUT=0V to VOB, PGD=0 10 mA VDS good PGD assertion condition VOB - VOUT (VOUT rising) 0.5 0.7 V VDS good delay PGD assertion delay VOB - VOUT (VOUT rising) 0.4 ms VGS good PGD assertion condition CTRL - VOUT (CTRL rising) 36 V VDS fail PGD de-assertion condition VOB - VOUT (VOUT falling) 12 18V VDS fail delay PGD de-assertion delay VOB - VOUT (VOUT falling) hot swap open 0.4 ms VDS fail delay PGD de-assertion delay VOB - VOUT (VOUT falling) hot swap closed 10 15 us Idc_OC1 VOUT OC1 protection VOUT>3V 2.0 3.0 A Td_OC1 OC1 PGD de-assertion delay OC1 PGD de-assertion delay 0.9 1 1.1 ms Idc_OC2 VOUT OC2 protection 4.0 6.0 A Td_OC2 OC2 PGD de-assertion delay OC2 PGD de-assertion delay 10 15 us Tretry After PGD de-assertion 9 10 11 ms STBY, FAUX, RAUX signals FAUX_thr, RAUX_thr, STBY_thr Threshold Signal rising, measured between VOB and AGND 1.20 1.25 1.30 V FAUX_hyst, RAUX_hyst, STBY_hyst Hysteresis Signal falling, measured between VOB and AGND 250 mV RAUX_del RAUX delay rising From RAUX = 1 to device acceptance 3.3 ms RAUX_del RAUX delay falling From RAUX = 0 to device acceptance 65 us FAUX_del FAUX delay From FAUX = 1 to device acceptance 1ms RAUX_res RAUX input resistance Measured from pin to AGND 250 400 kΩ RAUX_det_thr Threshold in detection range VDD=VOB=9V 1.0 2.0 V Sleep/Wkup_del Sleep/Wkup delay Input setup to sleep/wakeup delay 3.3 ms Shdn_del Shutdown delay Input setup to shutdown delay 3.3 ms Table 6. Electrical characteristics (continued) Symbol Parameter Test conditions Min. Typ. Max. Unit |
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