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IMXRT1160CEC датащи(PDF) 80 Page - NXP Semiconductors

номер детали IMXRT1160CEC
подробное описание детали  i.MX RT1160 Crossover Processors Data Sheet for Consumer Products
PDF  124 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
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IMXRT1160CEC датащи(HTML) 80 Page - NXP Semiconductors

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i.MX RT1160 Crossover Processors Data Sheet for Consumer Products, Rev. 0, 04/2021
80
NXP Semiconductors
Electrical characteristics
SR_LS
Slew rate in Low Speed
mode
Code 100h — F00h or
F00h — 100h @ZTC
current
—0.24
V/
s
5
Code 100h — F00h or
F00h —100h @PTAT
current
—0.24
SR_MS
Slew rate in Middle
Speed mode
Code 100h — F00h or
F00h — 100h @ZTC
current
—1.2
Code 100h — F00h or
F00h —100h @PTAT
current
—1.2
SR_HS
Slew rate in High Speed
mode
Code 100h — F00h or
F00h — 100h @ZTC
current
—2.4
Code 100h — F00h or
F00h —100h @PTAT
current
—2.4
PSRR
Power supply rejection
ratio
Code 800h,
Δ
VDD_ANA18 = 100 mV,
VREFH_ANA12 selected
—70
dB
6
Glitch
Glitch energy
Code 100h — F00h —
100h
—30
nV-s
Code 7FFh — 800h —
7FFh
—30
CT
Channel to channel
crosstalk
-80
dB
7
ROP
Output resistance
Code 100h — F00h and
Rload = 18 k
—200
8
1 It is recommended to operate the DAC in the output voltage range between 0.15 V and (VDDA_ADC_1P8 - 0.15 V) for best
accuracy. Linearity of the output voltage outside this range will be affected as current load increases.
2 When ADC_VREFH is selected as the reference (DAC_CR[DACRFS] = 0b).
3 When the internal 1.2 V source is selected as the reference (DAC_CR[DACRFS] = 1b).
4 The DAC output remains within ±0.5 LSB of the final measured value for digital input code change. Noise on the power supply
can cause this performance to degrade to ±1 LSB. This parameter represents both rising edge and falling edge settling time.
5 Time for the DAC output to transition from 10% to 90% signal amplitude (rising edge or falling edge).
6 PSRR = 20 x log{ΔVDD_ANA18 /ΔVDAC_OUT}
7 If two DACs are used and sharing the same VREFH.
8 Based on design simulation.
Table 77. DAC characteristics (continued)
Symbol
Description
Test Conditions
Min
Typ
Max
Unit
Notes



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