TLE5041plusC

Specification

3.4.4

Electrostatic discharge protection

Characterized according to Human Body Model (HBM) test in compliance with EIA/JESD22-A114-B HBM (covers

MIL STD 883D)

Table 7

ESD protection

Parameter

Notes

ESD voltage

Method AEC-Q100 (1.5 k

Ω, 100 pF)

ESD voltage

Method ANSI/ESD SP5.3.2-2008

3.5

Electro Magnetic Compatibility (EMC)

The device is characterized according to the IC level EMC requirements described in the “Generic IC EMC Test

Additionally component level EMC characterizations according to ISO 7637-2:2011, ISO 7637-3:2007 and ISO

16750-2:2010 regarding pulse immunity and CISPR 25 (2009-01) Ed. 3.0 regarding conducted emissions are

performed.

Note: Characterization of electromagnetic compatibility is carried out on sample base. Not all specification

parameters can be monitored during EMC exposure. Only functional parameters, e.g., switching current and

duty cycle have been monitored.

Figure 19 outlines all needed external components to operate the DUT under application conditions. The

(additional) outlined components can effect the final EMC result. They are treated as inherent part of the DUT

during component level EMC characterizations.

Figure 19

EMC test circuit for the TLE5041plusC

Data Sheet

24

V 1.2, 2018-01-18

Symbol

Values

Unit

min.

max.

V

HBM

±12

kV

V

SDM

±2

kV