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SLK2511IPZP датащи(PDF) 9 Page - Texas Instruments |
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SLK2511IPZP датащи(HTML) 9 Page - Texas Instruments |
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9 / 21 page ![]() SLK2511 OC-48/24/12/3 SONET/SDH MULTIRATE TRANSCEIVER SLLS522A – JUNE 2002 – REVISED OCTOBER 2002 9 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 detailed description (continued) Table 5. Reference Clock Frequency REFCLKSEL REFERENCE CLOCK FREQUENCY 0 622.08 MHz 1 155.52 MHz clock and data recovery The CDR unit of SLK2511 recovers the clock and data from the incoming data streams. In the event of receive data loss, the PLL automatically locks to the local REFCLK to maintain frequency stability. If the frequency of the data differs by more that 100 ppm with respect to the REFCLK frequency, the LOL pin is asserted as a warning. Actual loss of lock occurs if the data frequency differs by more than 170 ppm. minimum transition density The loop filter transfer function is optimized to enable the CDR to track ppm difference in the clocking and tolerate the minimum transition density that can be received in a SONET data signal ( ±20 ppm). The transfer function yields a typical capture time of 3500 bit times for random incoming NRZ data after the device is powered up and achieves frequency locking. The device tolerates up to 72 consecutive digits (CID) without sustaining an error. jitter transfer The jitter transfer is less than the mask shown in Figure 2 (GR-253 Figure 5-27). Jitter transfer function is defined as the ratio of jitter on the output signal to the jitter applied on the input signal versus frequency. The input sinusoidal jitter amplitude is applied up to the mask level in the jitter tolerance requirement (see Figure 3). OC-N/STS-N LEVEL fc (kHz) P (dB) 12 24 48 3 500 2000 130 0.1 0.1 0.1 Not Specified Slop = –20 dB / Decade Frequency – kHz fc P Figure 2. Jitter Transfer jitter tolerance Input jitter tolerance is defined as the peak-to-peak amplitude of sinusoidal jitter applied on the input signal that causes the equivalent 1-dB optical/electrical power penalty. This refers to the ability of the device to withstand input jitter without causing a recovered data error. The device has a jitter tolerance that exceeds the mask shown in Figure 3 (GR-253 Figure 5-28). This jitter tolerance is measured using a pseudorandom data pattern of 231 –1. |
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